Advances in X-Ray Analysis, John B. Newkirk; Gavin R. Mallett

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468474030 ISBN-13(EAN): 9781468474039
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Описание: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com- munity, a versatility limited only by the imagination and inge- nuity of the scientist, the designer of X-ray equipment, and the novice or student.

Автор: John B. Newkirk; Gavin R. Mallett; Heinz G. Pfeiff
Название: Advances in X-ray Analysis
ISBN: 1468486780 ISBN-13(EAN): 9781468486780
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Описание: X-ray emission spectrography, while based on Moseley`s work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago.

Автор: Gavin R. Mallett; Marie Fay; William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476351 ISBN-13(EAN): 9781468476354
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Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476084 ISBN-13(EAN): 9781468476088
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Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.

Автор: Charles S. Barrett; John B. Newkirk; Gavin R. Mall
Название: Advances in X-Ray Analysis
ISBN: 1468475371 ISBN-13(EAN): 9781468475371
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Описание: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.

Автор: William M. Mueller; Gavin R. Mallett; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848639X ISBN-13(EAN): 9781468486391
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Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.

Автор: Gregory J. McCarthy
Название: Advances in X-Ray Analysis
ISBN: 1461399890 ISBN-13(EAN): 9781461399896
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Описание: In keeping with recent practice, this year`s Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.

Автор: William M. Mueller; Gavin Mallet; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 1468486756 ISBN-13(EAN): 9781468486759
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Описание: A real need exists for ways to bridge the gap between basic research and prac- tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish- ments to the civilian economy.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468486330 ISBN-13(EAN): 9781468486339
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Автор: Burton Henke
Название: Advances in X-Ray Analysis
ISBN: 1461399653 ISBN-13(EAN): 9781461399650
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Описание: Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy.

Автор: K. Heinrich
Название: Advances in X-Ray Analysis
ISBN: 1461399718 ISBN-13(EAN): 9781461399711
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Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.

Автор: D. K. Smith
Название: Advances in X-Ray Analysis
ISBN: 1461399920 ISBN-13(EAN): 9781461399926
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Описание: Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied.