Defects in Advanced Electronic Materials and Novel Low Dimensional Structures, Chen, Weimin
Автор: Edmund G. Seebauer; Meredith C. Kratzer Название: Charged Semiconductor Defects ISBN: 1849968209 ISBN-13(EAN): 9781849968201 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: "Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
Автор: Fang, Tsang-Tse Название: Elements of Structures and Defects of Crystalline Materials ISBN: 0128142685 ISBN-13(EAN): 9780128142684 Издательство: Elsevier Science Рейтинг: Цена: 23749.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Elements of Structures and Defects of Crystalline Materials has been written to cover not only the fundamental principles behind structures and defects, but also to provide deep insights into understanding the relationships of properties, defect chemistry and processing of the concerned materials. Part One deals with structures, while Part Two covers defects. Since the knowledge of the electron configuration of elements is necessary for understanding the nature of chemical bonding, it is discussed in the opening chapter. Chapter Two then describes the bonding formation within the crystal structures of varied materials, with Chapter Three delving into how a material's structure is formed.
In view of the importance of the effects of the structure distortion on the material properties due to the fields, the related topics have been included in section 3.4. Moreover, several materials still under intensive investigation have been illustrated to provide deep insights into understanding the effects of the relationships of processing, structures and defects on the material properties.
The defects of materials are explored in Part II. Chapter 4 deals with the point defects of metal and ceramics. Chapter 5 covers the fundamentals of the characteristics of dislocations, wherein physics and the atomic mechanics of several issues have been described in detail. In view of the significant influence of the morphologies including size, shape and distribution of grains, phases on the microstructure evolution, and, in turn, the properties of materials, the final chapter focuses on the fundamentals of interface energies, including single phase (grain) boundary and interphase boundary.
Discusses the relationship between properties, defect chemistry and the processing of materials
Presents coverage of the fundamental principles behind structures and defects
Includes information on two-dimensional and three-dimensional imperfections in solids
Автор: Roman Louban Название: Image Processing of Edge and Surface Defects ISBN: 3642260357 ISBN-13(EAN): 9783642260353 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The edge and surface inspection is one of the most important and most challenging tasks in quality assessment in industrial production. Providing a valuable reference, this book offers a detailed description of optical methods for defect recognition.
Автор: Heslehurst Название: Defects and Damage in Composite Materials and Structures ISBN: 1138073695 ISBN-13(EAN): 9781138073692 Издательство: Taylor&Francis Рейтинг: Цена: 13014.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
The advantages of composite materials include a high specific strength and stiffness, formability, and a comparative resistance to fatigue cracking and corrosion. However, not forsaking these advantages, composite materials are prone to a wide range of defects and damage that can significantly reduce the residual strength and stiffness of a structure or result in unfavorable load paths.
Emphasizing defect identification and restitution, Defects and Damage in Composite Materials and Structures explains how defects and damage in composite materials and structures impact composite component performance. Providing ready access to an extensive, descriptive list of defects and damage types, this must-have reference:
Examines defect criticality in composite structures
Recommends repair actions to restore structural integrity
Discusses failure modes and mechanisms of composites due to defects
Reviews NDI processes for finding and identifying defects in composite materials
Relating defect detection methods to defect type, the author merges his experience in the field of in-service activities for composite airframe maintenance and repair with indispensable reports and articles on defects and damage in advanced composite materials from the last 50 years.
Автор: D. Walgraef; N.M. Ghoniem Название: Patterns, Defects and Materials Instabilities ISBN: 9401067554 ISBN-13(EAN): 9789401067553 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute, Cargese, France, September 4-15, 1989
Автор: Edmund G. Seebauer; Meredith C. Kratzer Название: Charged Semiconductor Defects ISBN: 1848820585 ISBN-13(EAN): 9781848820586 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of `defect engineering`. This book covers the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
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