Capacitance spectroscopy of semiconductors, 

Автор: Iraj Sadegh Amiri; Mahdi Ariannejad
Название: Introducing CTS (Copper-Tin-Sulphide) as a Solar Cell by Using Solar Cell Capacitance Simulator (SCAPS)
ISBN: 3030173941 ISBN-13(EAN): 9783030173944
Издательство: Springer
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Описание: This book discusses the enhancement of efficiency in currently used solar cells. The authors have characterized different structures of the solar cell system to optimize system parameters, particularly the performance of the Copper-Tin-Sulphide solar cell using Solar Cell Capacitance Simulator (SCAPS). This research can help scientist to overcome the current limitations and build up new designs of the system with higher efficiency and greater functionality. The authors have investigated the corresponding samples from various viewpoints, including structural (crystallinity, composition and surface morphology), optical (UV–vis–near-IR transmittance/re?ectance spectra) and electrical resistivity properties. Describes investigations on Cu2SnS3 solar cells and prospective low cost absorber layer of thin film solar cells;Discusses the potential device structure of Copper-Tin-Sulphide based on thin film technologies;Explains solar cell structure optimization to perform a higher conversion efficiency of Copper-Tin-Sulphide.

Автор: Wei Lu; Ying Fu
Название: Spectroscopy of Semiconductors
ISBN: 3030069435 ISBN-13(EAN): 9783030069438
Издательство: Springer
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Цена: 18167.00 р.
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Описание: The science and technology related to semiconductors have received significant attention for applications in various fields including microelectronics, nanophotonics, and biotechnologies. Understanding of semiconductors has advanced to such a level that we are now able to design novel system complexes before we go for the proof-of-principle experimental demonstration.This book explains the experimental setups for optical spectral analysis of semiconductors and describes the experimental methods and the basic quantum mechanical principles underlying the fast-developing nanotechnology for semiconductors. Further, it uses numerous case studies with detailed theoretical discussions and calculations to demonstrate the data analysis. Covering structures ranging from bulk to the nanoscale, it examines applications in the semiconductor industry and biomedicine. Starting from the most basic physics of geometric optics, wave optics, quantum mechanics, solid-state physics, it provides a self-contained resource on the subject for university undergraduates. The book can be further used as a toolbox for researching and developing semiconductor nanotechnology based on spectroscopy.

Автор: Lu
Название: Spectroscopy of Semiconductors
ISBN: 3319949527 ISBN-13(EAN): 9783319949529
Издательство: Springer
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Описание: 1 Optical Spectral Measurement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.1 Prism to disperse light . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31.2 Diffraction grating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81.3 Fourier transform spectroscopy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111.4 Modulation spectroscopy based on Fourier transform . . . . . . . . . . . . . 141.5 A few key notes in spectral measurement . . . . . . . . . . . . . . . . . . . . . . . 16References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 192 Introduction to Physics and Optical Properties of Semiconductors . . . 212.1 Energy band structure of electron state . . . . . . . . . . . . . . . . . . . . . . . . . 212.2 Lattice vibration and phonon spectrum . . . . . . . . . . . . . . . . . . . . . . . . . 362.3 Light-matter interaction and optical spectrum . . . . . . . . . . . . . . . . . . . 422.4 Polariton and spectral analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 633 Reflection and Transmission . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 653.1 Fresnel's equations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 663.2 Reflection and transmission by a thin film . . . . . . . . . . . . . . . . . . . . . . 723.3 Harmonic oscillator model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 783.4 Kramers-Kronig relationship . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 833.5 Thin film on substrate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 984 Photoluminescence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 994.1 Basic photoluminescence theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1014.2 Optical transitions in low-dimensional structures . . . . . . . . . . . . . . . . 1114.3 Photoluminescence of quantum well . . . . . . . . . . . . . . . . . . . . . . . . . . . 1244.4 V-grooved quantum wire . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1274.5 Quantum dot . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1334.6 Multiphoton excitation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 136References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .x Contents5 Modulation Spectroscopy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1455.1 Third-derivative modulation spectroscopy . . . . . . . . . . . . . . . . . . . . . . 1475.2 Photo-modulated reflectance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1505.3 Thermo-modulation spectroscopy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1555.4 Piezo-modulated reflectance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 159References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1656 Photocurrent Spectroscopy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1676.1 Basics of quantum we

Автор: G. Abstreiter; Atilla Aydinli; J.P. Leburton
Название: Optical Spectroscopy of Low Dimensional Semiconductors
ISBN: 9401063516 ISBN-13(EAN): 9789401063517
Издательство: Springer
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Цена: 27950.00 р.
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Описание: Proceedings of the NATO Advanced Study Institute, Ankara and Antalya, Turkey, 9-20 September 1996

Автор: Claudia S. Schnohr; Mark C. Ridgway
Название: X-Ray Absorption Spectroscopy of Semiconductors
ISBN: 3662522128 ISBN-13(EAN): 9783662522127
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

Автор: Mikla, Victor V.
Название: Trap Level Spectroscopy in Amorphous Semiconductors
ISBN: 0323165036 ISBN-13(EAN): 9780323165037
Издательство: Elsevier Science
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Цена: 18275.00 р.
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Описание: Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.

Автор: Claudia S. Schnohr; Mark C. Ridgway
Название: X-Ray Absorption Spectroscopy of Semiconductors
ISBN: 3662443619 ISBN-13(EAN): 9783662443613
Издательство: Springer
Рейтинг:
Цена: 18284.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.