Ellipsometry of Functional Organic Surfaces and Films, Hinrichs

Автор: Karsten Hinrichs; Klaus-Jochen Eichhorn
Название: Ellipsometry of Functional Organic Surfaces and Films
ISBN: 3662510200 ISBN-13(EAN): 9783662510209
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book provides a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.

Автор: Fujiwara
Название: Spectroscopic Ellipsometry for Photovoltaics
ISBN: 3319753754 ISBN-13(EAN): 9783319753751
Издательство: Springer
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Цена: 46118.00 р.
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Описание: This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Автор: Mathias Schubert
Название: Infrared Ellipsometry on Semiconductor Layer Structures
ISBN: 3642062288 ISBN-13(EAN): 9783642062285
Издательство: Springer
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Цена: 28732.00 р.
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Описание: The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.

Автор: Maria Losurdo; Kurt Hingerl
Название: Ellipsometry at the Nanoscale
ISBN: 3662519712 ISBN-13(EAN): 9783662519714
Издательство: Springer
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Цена: 32651.00 р.
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Описание: This book examines ellipsometry in nanoscience and nanotechnology. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving the science and technology of nanomaterials and related processes.

Автор: Fujiwara
Название: Spectroscopic Ellipsometry for Photovoltaics
ISBN: 3319951378 ISBN-13(EAN): 9783319951379
Издательство: Springer
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Цена: 30745.00 р.
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Описание: Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.