Автор: Braga Название: Atomic Force Microscopy in Biomedical Research ISBN: 1617791040 ISBN-13(EAN): 9781617791048 Издательство: Springer Рейтинг: Цена: 23058.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With its ability to explore the surface of the sample by means of a local scanning probe and its use of dedicated software allows to be visualize results, atomic force microscopy (AFM) has revolutionized the study of the smallest aspects of life. Atomic Force Microscopy in Biomedical Research: Methods and Protocols proves that this technology is no longer simply just another form of microscopy but has given rise to a completely new way of using microscopy that fulfils the dreams of all microscopists: being able to touch, move, and interact with the sample while it is being examined, thus making it possible to discover not only morphological but also chemical and physical structural information. Covering such topics as molecule imaging, nanoscale surface analysis and cellular imaging, force-spectroscopy, investigating drug action, and AFM as a nanotool, this volume features the most up-to-date techniques currently in use. Written in the Methods in Molecular Biology™ series format, chapters include introductions to their respective topics, lists of the necessary materials, step-by-step, readily reproducible protocols, and expert tips on troubleshooting and avoiding known pitfalls. Comprehensive and cutting-edge, Atomic Force Microscopy in Biomedical Research: Methods and Protocols brings together different types of applications in order to provide examples from diverse fields in the hope of inspiring researchers to apply their ingenuity in their own specialization and add significant originality to their varying studies.
Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.
Автор: Wright Kate Название: Scientific Researches in Atomic Force Microscopy ISBN: 1632384094 ISBN-13(EAN): 9781632384096 Издательство: Неизвестно Цена: 22990.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Pier Carlo Braga; Davide Ricci Название: Atomic Force Microscopy in Biomedical Research ISBN: 1493962795 ISBN-13(EAN): 9781493962792 Издательство: Springer Рейтинг: Цена: 23058.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Atomic force microscopy (AFM) has revolutionized the study of the smallest aspects of life. Covering topics like molecule imaging, nanoscale surface analysis and cellular imaging, this volume features the most up-to-date techniques currently in use.
Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 0306448904 ISBN-13(EAN): 9780306448904 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 030645596X ISBN-13(EAN): 9780306455964 Издательство: Springer Рейтинг: Цена: 22201.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Автор: Wright Kate Название: Atomic Force Microscopy: Biological Aspects ISBN: 1632380595 ISBN-13(EAN): 9781632380593 Издательство: Неизвестно Цена: 24943.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Peter Eaton and Paul West. Название: Atomic Force Microscopy ISBN: 0198826281 ISBN-13(EAN): 9780198826286 Издательство: Oxford Academ Рейтинг: Цена: 7206.00 р. Наличие на складе: Поставка под заказ.
Описание: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Автор: Sanders, Wesley C. (salt Lake Community College, Ut, Usa) Название: Atomic force microscopy ISBN: 036721864X ISBN-13(EAN): 9780367218645 Издательство: Taylor&Francis Рейтинг: Цена: 11789.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.
Автор: Nuno C. Santos; Filomena A. Carvalho Название: Atomic Force Microscopy ISBN: 1493994077 ISBN-13(EAN): 9781493994076 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Нет в наличии.
Описание: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.
Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola Название: Noncontact Atomic Force Microscopy ISBN: 3319155873 ISBN-13(EAN): 9783319155876 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.
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