Double-Prism Multi-mode Scanning: Principles and Technology, Anhu Li
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ISBN: 3662506017 ISBN-13(EAN): 9783662506011 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
Автор: Chunli Bai Название: Scanning Tunneling Microscopy and Its Application ISBN: 3642085008 ISBN-13(EAN): 9783642085000 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.
The book is intended as a detailed guide to use and evaluate the modern digital technology to build modern PET systems. Digital Positron Emission Tomography represents the most modern trend among non-invasive functional nuclear imaging techniques. The term digital is interpreted both in terms of hardware configuration and in terms of data stream analysis. Modern miniaturized sensors realized in Complementary Metal Oxide Semiconductor technology allow to reduce the physical size of detecting pixels to the sub-millimetric range. The new Multi Voltage Threshold method allows to digitize the signals from each pixel within few hundred picoseconds and to collect digital data for further analysis. The modern concept of digital PET requires new techniques of digital data analysis and physical interpretation based on high performance computing platforms, and requires also to define new methods and strategies for the verification of the medical product quality standards.
The book will describe the physical fundaments of a novel sensor, the MVT SiPM, able to detect single photons with a space resolution of 50 um and a time resolution of few tens of picosecods. We will describe the physical processes and we will show how to correctly simulate and understand its features. We will show how to design a Positron Emission Tomography system based on this sensor, including high performance computing and artificial intelligence approach as techniques for the new generation digital PET systems. The book will make clear the physical and mathematical fundaments of the digital innovation introduced by this new sensor.
Автор: Bert Voigtl?nder Название: Scanning Probe Microscopy ISBN: 3662505576 ISBN-13(EAN): 9783662505571 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.
Автор: Francesco Marinello; Daniele Passeri; Enrico Savio Название: Acoustic Scanning Probe Microscopy ISBN: 3642430791 ISBN-13(EAN): 9783642430794 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.
Автор: Bharat Bhushan; Harald Fuchs; Masahiko Tomitori Название: Applied Scanning Probe Methods X ISBN: 3642093426 ISBN-13(EAN): 9783642093425 Издательство: Springer Рейтинг: Цена: 27245.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Автор: Tanaka Nobuo Название: Scanning Transmission Electron Microscopy of Nanomaterials ISBN: 184816789X ISBN-13(EAN): 9781848167896 Издательство: World Scientific Publishing Рейтинг: Цена: 30888.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This title covers achievements in the field of STEM obtained with advanced technologies.
Автор: Nicolas Brodusch; Hendrix Demers; Raynald Gauvin Название: Field Emission Scanning Electron Microscopy ISBN: 9811044325 ISBN-13(EAN): 9789811044328 Издательство: Springer Рейтинг: Цена: 7685.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.
Автор: Bharat Bhushan; Harald Fuchs Название: Applied Scanning Probe Methods IV ISBN: 364206597X ISBN-13(EAN): 9783642065972 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- Applications of Heated Atomic Force Microscope Cantilevers.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 ISBN: 3662507250 ISBN-13(EAN): 9783662507254 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.
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