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Introduction to the Characterization of Residual Stress by Neutron Diffraction, Hutchings, M.T. , Withers, P.J. , Holden, T.M. ,


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Автор: Hutchings, M.T. , Withers, P.J. , Holden, T.M. ,
Название:  Introduction to the Characterization of Residual Stress by Neutron Diffraction
ISBN: 9780367393267
Издательство: Taylor&Francis
Классификация:




ISBN-10: 0367393263
Обложка/Формат: Paperback
Страницы: 420
Вес: 1.71 кг.
Дата издания: 20.12.2019
Язык: English
Размер: 231 x 155 x 23
Читательская аудитория: Tertiary education (us: college)
Основная тема: Applied Physics
Ссылка на Издательство: Link
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Поставляется из: Европейский союз
Описание:

Over the past 25 years the field of neutron diffraction for residual stress characterization has grown tremendously, and has matured from the stage of trial demonstrations to provide a practical tool with widespread applications in materials science and engineering. While the literature on the subject has grown commensurately, it has also remained fragmented and scattered across various journals and conference proceedings.

For the first time, this volume presents a comprehensive introduction to stress measurement using neutron diffraction. It discusses all aspects of the technique, from the basic physics, the different neutron sources and instrumentation, to the various strategies for lattice strain measurement and data interpretation. These are illustrated by practical examples. This book represents a coherent unified treatment of the subject, written by well-known experts. It will prepare students, engineers, and other newcomers for their first neutron diffraction experiments and provide experts with a definitive reference work.




Measurement of Residual and Applied Stress Using Neutron Diffraction

Автор: M.T. Hutchings; Aaron D. Krawitz
Название: Measurement of Residual and Applied Stress Using Neutron Diffraction
ISBN: 9401052425 ISBN-13(EAN): 9789401052429
Издательство: Springer
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Цена: 12157.00 р.
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Описание: Proceedings of the NATO Advanced Research Workshop, Oxford, U.K., 18-22 March, 1991

X-Ray and Neutron Dynamical Diffraction

Автор: Andr? Authier; Stefano Lagomarsino; Brian K. Tanne
Название: X-Ray and Neutron Dynamical Diffraction
ISBN: 1461376963 ISBN-13(EAN): 9781461376965
Издательство: Springer
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Цена: 6986.00 р.
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Описание: Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996

Fundamentals of powder diffraction and structural characterization of materials. 2 ed.

Автор: Pecharsky, Vitalij K. Zavalij, Peter
Название: Fundamentals of powder diffraction and structural characterization of materials. 2 ed.
ISBN: 0387095780 ISBN-13(EAN): 9780387095783
Издательство: Springer
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Цена: 15372.00 р.
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Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.

The Basics of Crystallography and Diffraction

Автор: Hammond, Christopher
Название: The Basics of Crystallography and Diffraction
ISBN: 0198738684 ISBN-13(EAN): 9780198738688
Издательство: Oxford Academ
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Цена: 8078.00 р.
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Описание: Crystallography and diffraction are widely used throughout science for studying structure. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.

Scalar Diffraction from a Circular Aperture

Автор: Charles J. Daly; Navalgund A.H.K. Rao
Название: Scalar Diffraction from a Circular Aperture
ISBN: 1461370019 ISBN-13(EAN): 9781461370017
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Scalar diffraction from a circular aperture is a ubiquitous problem that arises in a variety of disciplines, such as optics (lenses), acoustics (speakers), electromagnetics (dish antennas), and ultrasonics (piston transducers).

Development of an Ultrafast Low-Energy Electron Diffraction Setup

Автор: Max Gulde
Название: Development of an Ultrafast Low-Energy Electron Diffraction Setup
ISBN: 3319386964 ISBN-13(EAN): 9783319386966
Издательство: Springer
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Цена: 13059.00 р.
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Описание: This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films.

X-Ray Diffraction Imaging of Biological Cells

Автор: Nakasako
Название: X-Ray Diffraction Imaging of Biological Cells
ISBN: 4431566163 ISBN-13(EAN): 9784431566168
Издательство: Springer
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Цена: 23757.00 р.
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Описание: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.


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