X-Ray Diffraction Imaging of Biological Cells, Nakasako
Автор: Suryanarayana, C., Norton, M. Grant Название: X-Ray Diffraction, A Practical Approach ISBN: 030645744X ISBN-13(EAN): 9780306457449 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.
Описание: For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.
Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G Название: X-Ray Diffraction by Disordered Lamellar Structures ISBN: 364274804X ISBN-13(EAN): 9783642748042 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.
Автор: Oleg A. Glebov; Mikhail A. Krivoglaz Название: X-Ray and Neutron Diffraction in Nonideal Crystals ISBN: 3642742939 ISBN-13(EAN): 9783642742934 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.
Автор: P.P. Ewald Название: Fifty Years of X-Ray Diffraction ISBN: 1461599636 ISBN-13(EAN): 9781461599630 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Reuben Rudman Название: Low-Temperature X-Ray Diffraction ISBN: 1461587735 ISBN-13(EAN): 9781461587736 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.
Автор: C. Suryanarayana; M. Grant Norton Название: X-Ray Diffraction ISBN: 1489901507 ISBN-13(EAN): 9781489901507 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a hands on approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Автор: Henning Friis Poulsen Название: Three-Dimensional X-Ray Diffraction Microscopy ISBN: 366214543X ISBN-13(EAN): 9783662145432 Издательство: Springer Рейтинг: Цена: 22359.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda Название: X-Ray Diffraction Crystallography ISBN: 3642442552 ISBN-13(EAN): 9783642442551 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
Автор: Andr? Authier; Stefano Lagomarsino; Brian K. Tanne Название: X-Ray and Neutron Dynamical Diffraction ISBN: 1461376963 ISBN-13(EAN): 9781461376965 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru