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X-Ray Diffraction Imaging of Biological Cells, Nakasako


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Автор: Nakasako
Название:  X-Ray Diffraction Imaging of Biological Cells
ISBN: 9784431566168
Издательство: Springer
Классификация:








ISBN-10: 4431566163
Обложка/Формат: Hardcover
Страницы: 228
Вес: 0.54 кг.
Дата издания: 2018
Серия: Springer Series in Optical Sciences
Язык: English
Издание: 1st ed. 2018
Иллюстрации: 89 illustrations, color; 7 illustrations, black and white; xiii, 350 p. 96 illus., 89 illus. in color.
Размер: 161 x 243 x 28
Читательская аудитория: General (us: trade)
Основная тема: Optics, Lasers, Photonics, Optical Devices
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
Дополнительное описание:
Introduction.- X-ray diffraction.- Theory of X-ray diffraction imaging.- Diffraction apparatus for X-ray diffraction imaging.- Specimen preparation for X-ray diffraction imaging experiments at cryogenic temperature.- Processing of diffraction pattern



X-Ray Diffraction, A Practical Approach

Автор: Suryanarayana, C., Norton, M. Grant
Название: X-Ray Diffraction, A Practical Approach
ISBN: 030645744X ISBN-13(EAN): 9780306457449
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.

Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

Автор: P.K. Larsen; P.J. Dobson
Название: Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
ISBN: 1468455826 ISBN-13(EAN): 9781468455823
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Автор: Zhong-lin Wang
Название: Elastic and Inelastic Scattering in Electron Diffraction and Imaging
ISBN: 1489915818 ISBN-13(EAN): 9781489915818
Издательство: Springer
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Цена: 28734.00 р.
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Описание: For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.

X-Ray Diffraction by Disordered Lamellar Structures

Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G
Название: X-Ray Diffraction by Disordered Lamellar Structures
ISBN: 364274804X ISBN-13(EAN): 9783642748042
Издательство: Springer
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Цена: 14365.00 р.
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Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.

X-Ray and Neutron Diffraction in Nonideal Crystals

Автор: Oleg A. Glebov; Mikhail A. Krivoglaz
Название: X-Ray and Neutron Diffraction in Nonideal Crystals
ISBN: 3642742939 ISBN-13(EAN): 9783642742934
Издательство: Springer
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Цена: 14365.00 р.
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Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.

Fifty Years of X-Ray Diffraction

Автор: P.P. Ewald
Название: Fifty Years of X-Ray Diffraction
ISBN: 1461599636 ISBN-13(EAN): 9781461599630
Издательство: Springer
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Цена: 14365.00 р.
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Low-Temperature X-Ray Diffraction

Автор: Reuben Rudman
Название: Low-Temperature X-Ray Diffraction
ISBN: 1461587735 ISBN-13(EAN): 9781461587736
Издательство: Springer
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Цена: 14365.00 р.
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Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.

X-Ray Diffraction

Автор: C. Suryanarayana; M. Grant Norton
Название: X-Ray Diffraction
ISBN: 1489901507 ISBN-13(EAN): 9781489901507
Издательство: Springer
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Цена: 15672.00 р.
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Описание: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a hands on approach through experiments and examples based on actual laboratory data.
Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.
In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it.
Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.

Three-Dimensional X-Ray Diffraction Microscopy

Автор: Henning Friis Poulsen
Название: Three-Dimensional X-Ray Diffraction Microscopy
ISBN: 366214543X ISBN-13(EAN): 9783662145432
Издательство: Springer
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Цена: 22359.00 р.
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Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

X-Ray Diffraction Crystallography

Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda
Название: X-Ray Diffraction Crystallography
ISBN: 3642442552 ISBN-13(EAN): 9783642442551
Издательство: Springer
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Цена: 16977.00 р.
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Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.

X-Ray and Neutron Dynamical Diffraction

Автор: Andr? Authier; Stefano Lagomarsino; Brian K. Tanne
Название: X-Ray and Neutron Dynamical Diffraction
ISBN: 1461376963 ISBN-13(EAN): 9781461376965
Издательство: Springer
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Цена: 6986.00 р.
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Описание: Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996


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