Practical Electron Microscopy Of Lattice Defects, Hiroyasu Saka
Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 12751.00 р. 18216.00-30% Наличие на складе: Есть (2 шт.) Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Udo J. Birk Название: Super-Resolution Microscopy - A Practical Guide ISBN: 3527341331 ISBN-13(EAN): 9783527341337 Издательство: Wiley Рейтинг: Цена: 15674.00 р. Наличие на складе: Поставка под заказ.
Описание: This unique book on super-resolution microscopy techniques presents comparative, in-depth analyses of the strengths and weaknesses of the individual approaches.
Автор: Michael J. Dykstra; Laura E. Reuss Название: Biological Electron Microscopy ISBN: 0306477491 ISBN-13(EAN): 9780306477492 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Designed for an introductory one-semester course in biological electron microscopy. This work provides an introduction to the major technical approaches for sample preparation and instrumentation utilization to answer cytological questions. It covers conventional light microscopy, cryotechniques, fixation protocols, cytochemistry, and more.
Автор: Bonnell Dawn A Название: Scanning Probe Microscopy for Energy Research ISBN: 9814434701 ISBN-13(EAN): 9789814434706 Издательство: World Scientific Publishing Рейтинг: Цена: 31680.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Автор: Zewail, A.H. Название: 4D Electron Microscopy ISBN: 1848164009 ISBN-13(EAN): 9781848164000 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.
Автор: Ineson Название: Introduction to Practical Ore Microscopy ISBN: 113815041X ISBN-13(EAN): 9781138150416 Издательство: Taylor&Francis Рейтинг: Цена: 26796.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: First published in 1989. Routledge is an imprint of Taylor & Francis, an informa company.
Автор: Goerg H. Michler Название: Electron Microscopy of Polymers ISBN: 364207166X ISBN-13(EAN): 9783642071669 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book.
Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
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