Optical Metrology for Precision Engineering, Wei Gao, Yuki Shimizu
Автор: Wei Gao, Yuki Shimizu Название: Optical Metrology for Precision Engineering ISBN: 3110541092 ISBN-13(EAN): 9783110541090 Издательство: Walter de Gruyter Рейтинг: Цена: 23049.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book provides readers the fundamentals of optical metrology for precision engineering. The next-generation measurement technologies based on ultrashort pulse laser and optical frequency comb are also presented, making it an essential reference book for various engineering fields. • Introduces fundamental theories and techniques • Combines theories with practical applications • Presents technologies in an easy-to-understand way
Автор: Raghavendra, N V; Krishnamurthy, L Название: Engineering Metrology and Measurements ISBN: 0198085494 ISBN-13(EAN): 9780198085492 Издательство: Oxford Academ Цена: 4750.00 р. Наличие на складе: Поставка под заказ.
Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Автор: Chander Prakash; Sunpreet Singh Название: Characterization, Testing, Measurement, and Metrology ISBN: 0367275155 ISBN-13(EAN): 9780367275150 Издательство: Taylor&Francis Рейтинг: Цена: 28327.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.
Автор: Selim Shahriar, Jacob Scheuer Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X ISBN: 1510606793 ISBN-13(EAN): 9781510606791 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 18295.00 р. Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: French College Название: Metrology in Industry: The Key for Quality ISBN: 1905209517 ISBN-13(EAN): 9781905209514 Издательство: Wiley Рейтинг: Цена: 22010.00 р. Наличие на складе: Поставка под заказ.
Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.
Автор: Tom Proulx Название: Optical Measurements, Modeling, and Metrology, Volume 5 ISBN: 1461429056 ISBN-13(EAN): 9781461429050 Издательство: Springer Рейтинг: Цена: 36570.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.
Автор: Richard Leach Название: Advances in Optical Form and Coordinate Metrology ISBN: 0750325224 ISBN-13(EAN): 9780750325226 Издательство: INGRAM PUBLISHER SERVICES UK Рейтинг: Цена: 25344.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.
Автор: Krishnan, Kannan M. Название: Principles of Materials Characterization and Metrology ISBN: 0198830262 ISBN-13(EAN): 9780198830269 Издательство: Oxford Academ Рейтинг: Цена: 6176.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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