Metrology for Inclusive Growth of India, Aswal Dinesh K.
Автор: S. V. Gupta Название: Mass Metrology ISBN: 3030124649 ISBN-13(EAN): 9783030124649 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.
Автор: Xavier Silvani Название: Metrology for Fire Experiments in Outdoor Conditions ISBN: 1461479614 ISBN-13(EAN): 9781461479611 Издательство: Springer Рейтинг: Цена: 6529.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Natural fires can be considered as scale-dependant, non-linear processes of mass, momentum and heat transport, resulting from a turbulent reactive and radiative fluid medium flowing over a complex medium, the vegetal fuel.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Автор: Grabe Michael Название: Truth and Traceability in Physics and Metrology ISBN: 1643270982 ISBN-13(EAN): 9781643270982 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 3762.00 р. Наличие на складе: Нет в наличии.
Описание: This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Автор: Simon David S., Jaeger Gregg, Sergienko Alexander V. Название: Quantum Metrology, Imaging, and Communication ISBN: 3319835408 ISBN-13(EAN): 9783319835402 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Автор: Waldemar Nawrocki Название: Introduction to Quantum Metrology ISBN: 3319384791 ISBN-13(EAN): 9783319384795 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.
Автор: Bulska Ewa Название: Metrology in Chemistry ISBN: 3030075761 ISBN-13(EAN): 9783030075767 Издательство: Springer Рейтинг: Цена: 11878.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics - such as traceability, calibration, chemical reference materials, validation and uncertainty - are covered.
Автор: Crowder Stephen, Delker Collin, Forrest Eric Название: Introduction to Statistics in Metrology ISBN: 303053328X ISBN-13(EAN): 9783030533281 Издательство: Springer Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: 1. Introduction.- 2. Basic Concepts.- 3. The International System of Units (SI), Traceability, and Calibration.- 4. Introduction to Statistics and Probability.- 5. Measurement Uncertainty in Decision Making.- 6. The Measurement Model and Uncertainty.- 7. Analytical Methods for the Propagation of Uncertainties.- 8. Monte Carlo Methods for the Propagation of Uncertainties.- 9. Determining Uncertainties in Fitted Curves.- 10. Design of Experiments in Metrology.- 11. Special Topics in Metrology.- 12. Summary and Acknowledgments.
Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.
Автор: Graham T. Smith Название: Machine Tool Metrology ISBN: 3319251074 ISBN-13(EAN): 9783319251073 Издательство: Springer Рейтинг: Цена: 25155.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Machine Tools - an Introduction.- Laser Instrumentation and Calibration.- Optical Instrumentation for Machine Calibration.- Telescoping Ballbars and other Diagnostic Intrumentation.- Artefacts for Machine Verification.- Machine Tool Performance - Spindle Analysis; Corrosion and Oil Debris Monitoring; Thermography.- Uncertainty of Measurement and Statistical Process Control.- Machine Tool Reliability.- Total Productive Maintenance (TPM) and Reliability-centred Maintenance (RCM).
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