Quantitative Atomic-Resolution Electron Microscopy, 217, Hÿtch Martin, Hawkes Peter W.
Автор: Miron Amusia; Larissa Chernysheva; Victor Yarzhems Название: Handbook of Theoretical Atomic Physics ISBN: 366250782X ISBN-13(EAN): 9783662507827 Издательство: Springer Рейтинг: Цена: 34799.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This richly illustrated book presents the results of calculations of cross sections and probabilities of a broad variety of atomic processes with participation of photons and electrons, namely on photoabsorption, electron scattering and accompanying effects.
Автор: Hawkes Peter W., Hytch Martin Название: The Beginnings of Electron Microscopy - Part 2: Volume 221 ISBN: 0323989195 ISBN-13(EAN): 9780323989190 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.
Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.
Автор: Jill Guyonnet Название: Ferroelectric Domain Walls ISBN: 3319382772 ISBN-13(EAN): 9783319382777 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization.
Автор: Jill Guyonnet Название: Ferroelectric Domain Walls ISBN: 3319057499 ISBN-13(EAN): 9783319057491 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization.
Автор: Loucas G. Christophorou; James K. Olthoff Название: Fundamental Electron Interactions with Plasma Processing Gases ISBN: 1461347416 ISBN-13(EAN): 9781461347415 Издательство: Springer Рейтинг: Цена: 27950.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The primary electron-molecule interaction processes of elastic and in- elastic electron scattering, electron-impact ionization, electron-impact dissociation, and electron attachment are discussed, and state-of-the- art authoritative data on the cross sections of these processes as well as on rate and transport coefficients are provided.
Автор: Hawkes Peter W., Hytch Martin Название: The Beginnings of Electron Microscopy - Part 1 ISBN: 0323915078 ISBN-13(EAN): 9780323915076 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more.
Автор: Pratibha L. Gai Название: In-Situ Microscopy in Materials Research ISBN: 1461378508 ISBN-13(EAN): 9781461378501 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Celano Umberto Название: Electrical Atomic Force Microscopy for Nanoelectronics ISBN: 3030156141 ISBN-13(EAN): 9783030156145 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.
Автор: Umberto Celano Название: Electrical Atomic Force Microscopy for Nanoelectronics ISBN: 3030156117 ISBN-13(EAN): 9783030156114 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
