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The Beginnings of Electron Microscopy - Part 2: Volume 221, Hawkes Peter W., Hytch Martin


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Автор: Hawkes Peter W., Hytch Martin
Название:  The Beginnings of Electron Microscopy - Part 2: Volume 221
ISBN: 9780323989190
Издательство: Elsevier Science
Классификация:



ISBN-10: 0323989195
Обложка/Формат: Hardcover
Страницы: 544
Вес: 0.89 кг.
Дата издания: 29.04.2022
Серия: Advances in imaging and electron physics
Язык: English
Размер: 22.86 x 15.24 x 3.02 cm
Ссылка на Издательство: Link
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Поставляется из: Европейский союз
Описание: The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.


4d electron microscopy

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
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Цена: 12751.00 р. 18216.00 -30%
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Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.

Handbook of Transmission Electron Microscopy

Автор: Page Lisa
Название: Handbook of Transmission Electron Microscopy
ISBN: 1632382830 ISBN-13(EAN): 9781632382832
Издательство: Неизвестно
Цена: 28506.00 р.
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New Horizons of Applied Scanning Electron Microscopy

Автор: Kenichi Shimizu; Tomoaki Mitani
Название: New Horizons of Applied Scanning Electron Microscopy
ISBN: 3642031595 ISBN-13(EAN): 9783642031595
Издательство: Springer
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Цена: 19591.00 р.
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Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.

Advanced Transmission Electron Microscopy

Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena
Название: Advanced Transmission Electron Microscopy
ISBN: 3319151762 ISBN-13(EAN): 9783319151762
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.

Electron Microscopy

Автор: Kuo John
Название: Electron Microscopy
ISBN: 1627037756 ISBN-13(EAN): 9781627037754
Издательство: Springer
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Цена: 34937.00 р.
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Описание:

1. Conventional Specimen Preparation Techniques For Transmission Electron Microscopy of Cultured Cells

John J. Bozzola

2. Microwave-assisted Processing and Embedding for Transmission Electron Microscopy

Paul Webster

3. Processing Plant Tissues for Ultrastructural Study John Kuo

4. Staining Sectioned Biological Specimens for Transmission Electron Microscopy:

Conventional and En Bloc Stains

E. Ann Ellis

5. Metal Shadowing for Electron Microscopy

Gregory M. Hendricks

6. Freeze Fracture and Freeze Etching

Douglas E. Chandler and William P. Sharp

7. Conventional Specimen Preparation Techniques For Scanning Electron Microscopy of Biological Specimens

John J. Bozzola

8. High-pressure Freezing: Current State and Future Prospects

Andres Kaech and Urs Ziegler

9. Cryo-fixation by Self-pressurized Rapid Freezing

Markus Grabenbauer, Hong-Mei Han, and Jan Huebinger

10. Cryo-Electron Microscopy of Vitreous Sections

Petr Chlanda and Martin Sachse

11. Negative Staining and Cryo-negative Staining: Applications in Biology and Medicine

J. Robin Harris

12. Electron Microscopy of the Microtubule Cytoskeleton Assembly Vitro

Margaret Coughlin, Aaron C. Groen, Timothy J. Mitchison

13. Cryosectioning Fixed and Cryoprotected Biological Material for Immmunocytochemistry

Paul Webster and Alexandre Webster

14. Analysis of Specificity in Immunoelectron Microscopy

Christian Hacker and John M. Lucocq

15. Cryo-Electron Microscopy of Membrane Proteins

Kenneth N. Goldie, Priyanka Abeyrathne, Fabian Kebbel, Mohamed Chami, Philippe Ringler, and Henning Stahlberg

16. Tracking DNA and RNA Sequences at High Resolution

Dusan Cmarko, Anna Ligasovб, and Karel Koberna

17. Visualization of DNA and Protein-DNA Complexes with Atomic Force Microscopy

Yuri L. Lyubchenko, Alexander A. Gall, and Luda S. Shlyakhtenko

18. Biological Applications of Phase-Contrast Electron Microscopy

Kuniaki Nagayama

19. Single Particle Cryo-Electron Microscopy And 3-D Reconstruction Of Viruses

Fei Guo and Wen Jiang

20. Electron Tomography for Organelles, Cells and Tissues

Wanzhong He and Yongning He

21. Correlative Light and Electron Microscopy: from Live Cell Dynamic to 3D Ultrastructure

Coralie Spiegelhalter, Jocelyn F. Laporte, and Yannick Schwab

22. Nanometer-resolution Fluorescence Electron Microscopy (Nano-EM) in Cultured Cells

Shigeki Watanabe, Martin Lehmann, Edward Hujber, Richard D. Fetter, Jackson Richards, Berit Sцhl-Kielczynski, Annegret Felies, Christian Rosenmund, Jan Schmoranzer, and Erik M. Jorgensen

23. Correlative Fluorescence- and Electron Microscopy of Quantum Dot Labeled Proteins on Whole Cells in Liquid

Diana B. Peckys, Madeline J. Dukes, and Niels de Jonge

24. FIB-SEM Tomography in Biology

Caroline Kizilyaprak

25. Correlative Light and Electron Microscopy using Immunolabeled Sections

Heinz Schwarz and Bruno M. Humbel

26. Correlative 3D Imaging: CLSM and FIB-SEM Tomography Using High-Pressure Frozen, Freeze-Substituted Biological Samples

Miriam S. Lucas, Maja Guenthert, Philippe Gasser, Falk Lucas and Roger Wepf

27. Three-dimensional Imaging of Adherent Cells using FIB-SEM and STEM

Clarissa Villinger, Martin Schauflinger, Heiko Gregorius, Christine Kranz, Katharina Hцhn, Soufi Nafeey, Paul Walther

28. X-Ray Microanalysis in the Scanning Electron Microscope

Godfried M. Roomans and Anca Dragomir

29. Application of SEM and EDX in Studying Biomineralization in Plant Tissues

Honghua He

30. Freeze Stabilization and Cryopreparation Technique for Visualizing the Water Distribution in Woody Tissues by X-ray Im

A Manual of Applied Techniques for Biological Electron Microscopy

Автор: Michael J. Dykstra
Название: A Manual of Applied Techniques for Biological Electron Microscopy
ISBN: 0306444496 ISBN-13(EAN): 9780306444494
Издательство: Springer
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Цена: 19591.00 р.
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Описание: This easy-to-follow manual describes tested procedures used to prepare biological samples for scanning and transmission electron microscopy, as well as methods for cytochemistry, immunocytochemistry, and scientific photography.

Biological Electron Microscopy

Автор: Michael J. Dykstra; Laura E. Reuss
Название: Biological Electron Microscopy
ISBN: 0306477491 ISBN-13(EAN): 9780306477492
Издательство: Springer
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Цена: 16769.00 р.
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Описание: Designed for an introductory one-semester course in biological electron microscopy. This work provides an introduction to the major technical approaches for sample preparation and instrumentation utilization to answer cytological questions. It covers conventional light microscopy, cryotechniques, fixation protocols, cytochemistry, and more.

In-Situ Microscopy in Materials Research

Автор: Pratibha L. Gai
Название: In-Situ Microscopy in Materials Research
ISBN: 1461378508 ISBN-13(EAN): 9781461378501
Издательство: Springer
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Цена: 30606.00 р.
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Описание: 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1 Profile Mode 288 3. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 1 Surface Steps 295 3.

Electron Microscopy and Analysis 2003

Название: Electron Microscopy and Analysis 2003
ISBN: 0367394537 ISBN-13(EAN): 9780367394530
Издательство: Taylor&Francis
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Цена: 9798.00 р.
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Описание: Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK.

Computer Techniques For Image Processing In Electron Microscopy,214

Автор: Hawkes, Peter W.
Название: Computer Techniques For Image Processing In Electron Microscopy,214
ISBN: 0128209992 ISBN-13(EAN): 9780128209998
Издательство: Elsevier Science
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Цена: 30318.00 р.
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Описание:

Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.

Sample Preparation Handbook for Transmission Electron Microscopy

Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil;
Название: Sample Preparation Handbook for Transmission Electron Microscopy
ISBN: 1489998853 ISBN-13(EAN): 9781489998859
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.

Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope

Автор: Anjam Khursheed
Название: Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope
ISBN: 9811227020 ISBN-13(EAN): 9789811227028
Издательство: World Scientific Publishing
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Цена: 17424.00 р.
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Описание:

This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.






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