Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.
Описание: This volume is a continuation of two prior books on advanced electron microscope techniques. The mission of the present volume remains that of a source book for the research practitioner or advanced student, especially one already well versed in basic electron optical methods.
Автор: Michael J. Dykstra; Laura E. Reuss Название: Biological Electron Microscopy ISBN: 0306477491 ISBN-13(EAN): 9780306477492 Издательство: Springer Рейтинг: Цена: 11219 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Designed for an introductory one-semester course in biological electron microscopy. This work provides an introduction to the major technical approaches for sample preparation and instrumentation utilization to answer cytological questions. It covers conventional light microscopy, cryotechniques, fixation protocols, cytochemistry, and more.
Описание: Cryoelectron microscopy of biological molecules is an important area in biophysics and structural biology. CryoEM is likely to take over much of the structural approaches that require X-ray crystallography. This book is useful for workers who employ CryoEM for structural studies in their own research.
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 13107 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Описание: Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
Описание: The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Автор: Zewail, A.H. Название: 4D Electron Microscopy ISBN: 1848164009 ISBN-13(EAN): 9781848164000 Издательство: World Scientific Publishing Рейтинг: Цена: 4857 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.
Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.
Автор: P. Michael Conn Название: Techniques in Confocal Microscopy, ISBN: 0123846587 ISBN-13(EAN): 9780123846587 Издательство: Elsevier Science Рейтинг: Цена: 5549 р. 6166.00-10% Наличие на складе: Поставка под заказ.
As part of the Reliable Lab Solutions series, Techniques in Confocal Microscopy brings together chapters from volumes 302, 307 and 356 of Methods in Enzymology. It documents many diverse uses for confocal microscopy in disciplines that broadly span biology.
It documents many diverse uses for confocal microscopy in disciplines that broadly span biology. The methods presented include shortcuts and conveniences not included in the initial publications Techniques are described in a context that allows comparisons to other related methodologies. Methodologies are laid out in a manner that stresses their general applicability and reports their potential limitations.
Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.
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