The Beginnings of Electron Microscopy - Part 1, Hawkes Peter W., Hytch Martin
Автор: Hawkes Peter W., Hytch Martin Название: The Beginnings of Electron Microscopy - Part 2: Volume 221 ISBN: 0323989195 ISBN-13(EAN): 9780323989190 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.
Автор: Pratibha L. Gai Название: In-Situ Microscopy in Materials Research ISBN: 1461378508 ISBN-13(EAN): 9781461378501 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.
Автор: Hÿtch Martin, Hawkes Peter W. Название: Quantitative Atomic-Resolution Electron Microscopy, 217 ISBN: 0128246073 ISBN-13(EAN): 9780128246078 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting, Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Автор: Efstathios K. Polychroniadis; Ahmet Yavuz Oral; Me Название: International Multidisciplinary Microscopy Congress ISBN: 3319377094 ISBN-13(EAN): 9783319377094 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The International Multidisciplinary Microscopy Congress (INTERM2013) was organized on October 10-13, 2013.
Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat Название: Bringing Scanning Probe Microscopy up to Speed ISBN: 1461373530 ISBN-13(EAN): 9781461373537 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.
Автор: Celano Umberto Название: Electrical Atomic Force Microscopy for Nanoelectronics ISBN: 3030156141 ISBN-13(EAN): 9783030156145 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.
Автор: Jill Guyonnet Название: Ferroelectric Domain Walls ISBN: 3319057499 ISBN-13(EAN): 9783319057491 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization.
Автор: Jill Guyonnet Название: Ferroelectric Domain Walls ISBN: 3319382772 ISBN-13(EAN): 9783319382777 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization.
Автор: Herbert Hopster; Hans Peter Oepen Название: Magnetic Microscopy of Nanostructures ISBN: 3642072860 ISBN-13(EAN): 9783642072864 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by leading scientists in the field, the book covers synchrotron based methods, spin-polarized electron methods, and scanning probe techniques.
Автор: Weilie Zhou; Zhong Lin Wang Название: Scanning Microscopy for Nanotechnology ISBN: 1441922091 ISBN-13(EAN): 9781441922090 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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