3D Microelectronic Packaging: From Fundamentals to Applications, Li Yan, Goyal Deepak
Автор: J?rg Schwizer; Michael Mayer; Oliver Brand Название: Force Sensors for Microelectronic Packaging Applications ISBN: 3642060633 ISBN-13(EAN): 9783642060632 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Sensor Design.- Measurement System.- Characterization.- Applications.- Conclusions and Outlook.
Автор: Yeh Lian-Tuu Название: Thermal Design of Liquid Cooled Microelectronic Equipment ISBN: 0791861937 ISBN-13(EAN): 9780791861936 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 20097.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Focuses on providing practical solutions to thermal issues related to high power systems where liquid cooling is required. The book serves as a general thermal design guide for any liquid cooled systems with the main focus on microelectronic equipment that includes digital and/or analogue devices.
Автор: J. T. Milek Название: Silicon Nitride for Microelectronic Applications ISBN: 1461596114 ISBN-13(EAN): 9781461596110 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Radio-Frequency Microelectronic Circuits for Telecommunication Applications covers the design issues of radio-frequency microelectronic circuits for telecommunication applications with emphasis on devices and circuit-level design.
Описание: Devices based on disordered semiconductors have wide applications. This textbook connects characteristic features of the atomic and electronic structures of disordered semiconductors and the device design process on the basis of these materials.
Описание: Radio-Frequency Microelectronic Circuits for Telecommunication Applications covers the design issues of radio-frequency microelectronic circuits for telecommunication applications with emphasis on devices and circuit-level design.
Название: Defects in Microelectronic Materials and Devices ISBN: 0367386399 ISBN-13(EAN): 9780367386399 Издательство: Taylor&Francis Рейтинг: Цена: 10104.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Uncover the Defects that Compromise Performance and Reliability As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.
A comprehensive survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies, this book also discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices. These defects can profoundly affect the yield, performance, long-term reliability, and radiation response of microelectronic devices and integrated circuits (ICs). Organizing the material to build understanding of the problems and provide a quick reference for scientists, engineers and technologists, this text reviews yield- and performance-limiting defects and impurities in the device silicon layer, in the gate insulator, and/or at the critical Si/SiO2 interface. It then examines defects that impact production yield and long-term reliability, including:
Vacancies, interstitials, and impurities (especially hydrogen)
Negative bias temperature instabilities
Defects in ultrathin oxides (SiO2 and silicon oxynitride)
Take A Proactive Approach The authors condense decades of experience and perspectives of noted experimentalists and theorists to characterize defect properties and their impact on microelectronic devices. They identify the defects, offering solutions to avoid them and methods to detect them. These include the use of 3-D imaging, as well as electrical, analytical, computational, spectroscopic, and state-of-the-art microscopic methods. This book is a valuable look at challenges to come from emerging
Автор: R.A. Levy Название: Microelectronic Materials and Processes ISBN: 0792301544 ISBN-13(EAN): 9780792301547 Издательство: Springer Рейтинг: Цена: 48774.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute, Il Ciocco, Castelvecchio Pascoli, Italy, June 30-July 11, 1986
Описание: An understanding of modeling and simulation techniques is becoming increasingly essential for engineers and researchers working with microelectronic packaging, interconnection design, and assembly manufacturing. This book shows for the first time how to model and simulate various processes in manufacturing, reliability, and testing.
Автор: Gross Название: Chemical Perspectives of Microelectronic Materials ISBN: 1107410843 ISBN-13(EAN): 9781107410848 Издательство: Cambridge Academ Цена: 4277.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Автор: G.G. Harman; Pavel Mach Название: Microelectronic Interconnections and Assembly ISBN: 9401061599 ISBN-13(EAN): 9789401061599 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Research Workshop, Prague, Czech Republic, 18-21 May 1996
Автор: Sedra, Adel S. (distinguished Professor Emeritus Of Electrical And Computer Engineering, Distinguished Professor Emeritus Of Electrical And Computer E Название: Microelectronic circuits ISBN: 0190853506 ISBN-13(EAN): 9780190853501 Издательство: Oxford Academ Рейтинг: Цена: 20907.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This Courseware package consist out of two publications, Agile Foundation Courseware - English and you are adviced to obtain the publication Agile for responsive organizations - A Pocket Guide. This courseware is for the Agile Foundation certification by the Agile Consortium, and follows the Certify to Inspire philosophy, enabling continuous learning and an adaptive mindset in an Agile world and corporate environment. This courseware has been reviewed by Agile Consortium board members and been accredited by Van Haren Learning Solutions.This Courseware provides a didactic journey in Agile, including teasers, energizers and many little assignments. There is also a reference to free online Agile literature and to the online Agile Foundation demo exam. The main modules of this exam are: o What is Agileo Agile Culture and Leadershipo Scrumo Methods and frameworkso Agile way of workingo Value and Continuous deliveryo Empiricism and improvementModules of this course ware:o What is Agileo Fundamental systems to Agile¢ XP¢ Crystal¢ Scrum¢ DSDMo Philosophizingo Scalingo Kanbano Lean StartupAbout the Agile Foundation CertificationThe Agile Foundation certificate is intended for those who are relatively new to the concept of "Agile" and would like to discover what it exactly entails.The idea behind this exam is that you are serious about delving into the Agility concept and related practices. How you decide to do that will be up to you. You can read books, articles, or blogs. You can also watch videos, listen to podcasts, attend events, or observe others who are working with Agile in practice. Or another possibility is to follow a course in Agile.The Agile Foundation Exam is an independent exam meaning it is not tied to a specific method. If you have the Agile Foundation certificate, you will have demonstrated you understand what Agile means and that you can identify the methods and concepts most commonly used in Agile organizations.
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