High Sensitivity Magnetometers, Grosz Asaf, Haji-Sheikh Michael J., Mukhopadhyay Subhas C.
Автор: Cesare Buffa Название: MEMS Lorentz Force Magnetometers ISBN: 3319866192 ISBN-13(EAN): 9783319866192 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book deals with compasses for consumer applications realized in MEMS technology, to support location-based and orientation-based services in addition to ‘traditional’ functionalities based on navigation. Navigation is becoming a must-have feature in portable devices and the presence of a compass also makes location-based augmented reality emerge, where a street map or a camera image could be overlaid with highly detailed information about what is in front of the user. To make these features possible both industries and scientific research focus on three axis magnetometers. The author describes a full path from specifications (driven by customers’ needs/desires) to prototype and preparing the way to industrialization and commercialization. The presentation includes an overview of all the major steps of this research and development process, highlighting critical points and potential pitfalls, as well as how to forecast or mitigate them. Coverage includes system design, specifications fulfillment, design strategy and project development methodology, in addition to traditional topics such as microelectronics design, sensor design, development of an experimental setup and characterization. The author uses a practical approach, including pragmatic guidelines and design choices, while maintaining focus on the final target, prototyping in the direction of industrialization and mass production.
Описание: Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. This title reviews the importance of a defect-sensitivity analysis in contemporary VLSI design procedures.
Автор: Grosz Название: High Sensitivity Magnetometers ISBN: 3319340689 ISBN-13(EAN): 9783319340685 Издательство: Springer Рейтинг: Цена: 25155.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book gathers, for the first time, an overview of nearly all of the magnetic sensors that exist today. The book is offering the readers a thorough and comprehensive knowledge from basics to state-of-the-art and is therefore suitable for both beginners and experts. From the more common and popular AMR magnetometers and up to the recently developed NV center magnetometers, each chapter is describing a specific type of sensor and providing all the information that is necessary to understand the magnetometer behavior including theoretical background, noise model, materials, electronics, design and fabrication techniques, etc.
Автор: Cesare Buffa Название: MEMS Lorentz Force Magnetometers ISBN: 3319594117 ISBN-13(EAN): 9783319594118 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Coverage includes system design, specifications fulfillment, design strategy and project development methodology, in addition to traditional topics such as microelectronics design, sensor design, development of an experimental setup and characterization.
Автор: Eugene A. Ustinov Название: Sensitivity Analysis in Remote Sensing ISBN: 3319158406 ISBN-13(EAN): 9783319158402 Издательство: Springer Рейтинг: Цена: 7182.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The beginners in remote sensing could use it as a single source, covering key issues of SA, from general principles, through formulation of corresponding linearized and adjoint problems, to practical applications to uncertainty analysis and inverse problems in remote sensing.
Автор: X.J. Fan; E. Suhir Название: Moisture Sensitivity of Plastic Packages of IC Devices ISBN: 1461426251 ISBN-13(EAN): 9781461426257 Издательство: Springer Рейтинг: Цена: 34937.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides information on the state-of-the-art techniques and methodologies related to moisture issues in plastic packages. It includes numerous industrial applications, along with the results of the most recent research and development efforts.
Описание: This book presents a comprehensive introduction to design sensitivity analysis theory as applied to electromagnetic systems. It treats the subject in a unified manner, providing numerical methods and design examples. The specific focus is on continuum design sensitivity analysis, which offers significant advantages over discrete design sensitivity methods. Continuum design sensitivity formulas are derived from the material derivative in continuum mechanics and the variational form of the governing equation. Continuum sensitivity analysis is applied to Maxwell equations of electrostatic, magnetostatic and eddy-current systems, and then the sensitivity formulas for each system are derived in a closed form; an integration along the design interface.The book also introduces the recent breakthrough of the topology optimization method, which is accomplished by coupling the level set method and continuum design sensitivity. This topology optimization method enhances the possibility of the global minimum with minimised computational time, and in addition the evolving shapes during the iterative design process are easily captured in the level set equation. Moreover, since the optimization algorithm is transformed into a well-known transient analysis algorithm for differential equations, its numerical implementation becomes very simple and convenient. Despite the complex derivation processes and mathematical expressions, the obtained sensitivity formulas are very straightforward for numerical implementation. This book provides detailed explanation of the background theory and the derivation process, which will help readers understand the design method and will set the foundation for advanced research in the future.