Earth Leakage Trip, Chaney, Paul

Автор: Fanucchi R. J.
Название: Cranial Leakage
ISBN: 0989026965 ISBN-13(EAN): 9780989026963
Издательство: Неизвестно
Цена: 2750.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Conceived in darkness, it feeds off the host. It is poked at and prodded, all the while growing within the confines of the author's mind until it reaches that point where it will no longer be contained. It forces its way through the porous openings in the skull, insinuates itself into the bloodstream, feeds into the very cells of its host, who has only one desire - to rid itself of this parasite before it is driven insane.Cranial LeakageAn otherworldly artist finds beauty in man's depravity...One woman's therapy session frees more than just memories...A fertility ritual delivers more than just an abundant harvest...The ultimate hot sauce proves to be too much for one man...An obsession with dreams pushes one woman over the edge...... and many more

Автор: Siva G. Narendra; Anantha P. Chandrakasan
Название: Leakage in Nanometer CMOS Technologies
ISBN: 1441938265 ISBN-13(EAN): 9781441938268
Издательство: Springer
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Цена: 26120.00 р.
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Описание: Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles.

Автор: Yingjiu Li; Qiang Yan; Robert H. Deng
Название: Leakage Resilient Password Systems
ISBN: 3319175025 ISBN-13(EAN): 9783319175027
Издательство: Springer
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Цена: 6986.00 р.
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Описание: This book investigates tradeoff between security and usability in designing leakage resilient password systems (LRP) and introduces two practical LRP systems named Cover Pad and ShadowKey.

Автор: Nikhil Jayakumar; Suganth Paul; Rajesh Garg
Название: Minimizing and Exploiting Leakage in VLSI Design
ISBN: 1489985298 ISBN-13(EAN): 9781489985293
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This book presents two techniques to reduce leakage power in digital VLSI ICs. The first reduces leakage through the selective use of high threshold voltage sleep transistors, while the second by applying the optimal Reverse Body Bias voltage.

Автор: Taikang Liu; Yongmei Li
Название: Electromagnetic Information Leakage and Countermeasure Technique
ISBN: 9811043515 ISBN-13(EAN): 9789811043512
Издательство: Springer
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Цена: 19564.00 р.
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Описание: This book presents a model of electromagnetic (EM) information leakage based on electromagnetic and information theory. It discusses anti-leakage, anti-interception and anti-reconstruction technologies from the perspectives of both computer science and electrical engineering. In the next five years, the threat posed by EM information leakage will only become greater, and the demand for protection will correspondingly increase. The book systematically introduces readers to the theory of EM information leakage and the latest technologies and measures designed to counter it, and puts forward an EM information leakage model that has established the foundation for new research in this area, paving the way for new technologies to counter EM information leakage. As such, it offers a valuable reference guide for all researchers and engineers involved in EM information leakage and countermeasures.

Автор: McLaughlin Mark
Название: Cranial Leakage: Tales from the Grinning Skull, Volume II
ISBN: 0997388285 ISBN-13(EAN): 9780997388282
Издательство: Неизвестно
Цена: 2750.00 р.
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Автор: Songling Huang, Wei Zhao
Название: Magnetic Flux Leakage: Theories and Imaging Technologies
ISBN: 3110477017 ISBN-13(EAN): 9783110477016
Издательство: Walter de Gruyter
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Цена: 18586.00 р.
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Описание: This book systematically introduces magnetic flux leakage testing principles and their applications in practice. Signal detection, collection, processing, the inversion of magnetic flux leakage defect and 3D imaging are discussed in detail with extensive project experiences, making the book an essential reference for researchers, developers and engineers in nondestructive testing.