Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.
Описание: The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.
Автор: Eric J. Mittemeijer; Paolo Scardi Название: Diffraction Analysis of the Microstructure of Materials ISBN: 3642073522 ISBN-13(EAN): 9783642073526 Издательство: Springer Рейтинг: Цена: 32651.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.
Автор: Lyle H. Schwartz; Jerome B. Cohen Название: Diffraction from Materials ISBN: 3642829295 ISBN-13(EAN): 9783642829291 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950`s and 60`s.
Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda Название: X-Ray Diffraction Crystallography ISBN: 3642442552 ISBN-13(EAN): 9783642442551 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
Автор: Reuben Rudman Название: Low-Temperature X-Ray Diffraction ISBN: 1461587735 ISBN-13(EAN): 9781461587736 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.
Автор: Masayoshi Nakasako Название: X-Ray Diffraction Imaging of Biological Cells ISBN: 4431568670 ISBN-13(EAN): 9784431568674 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
Автор: Suryanarayana, C., Norton, M. Grant Название: X-Ray Diffraction, A Practical Approach ISBN: 030645744X ISBN-13(EAN): 9780306457449 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.
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