X-Ray Diffraction Imaging of Biological Cells, Masayoshi Nakasako
Название: X-Ray Diffraction Imaging ISBN: 1498783619 ISBN-13(EAN): 9781498783613 Издательство: Taylor&Francis Рейтинг: Цена: 23734.00 р. Наличие на складе: Поставка под заказ.
Описание: Coherent scattering mechanism forms a basis of the x-ray diffraction imaging that is a subject of this book. The x-ray diffraction technology and its various applications in medical, industrial and security fields are also covered.
Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.
Автор: Ersoy, Okan K. Название: Diffraction, Fourier Optics and Imaging ISBN: 0471238163 ISBN-13(EAN): 9780471238164 Издательство: Wiley Рейтинг: Цена: 22326.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Fourier and Diffractive Optics is a required course in electrical engineering and physics programs. Based upon Professor Ersoy`s class notes, Diffraction, Fourier Optics and Imaging is an innovative and comprehensive work, presenting both theory and applications using MATLAB in examples and exercises.
Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G Название: X-Ray Diffraction by Disordered Lamellar Structures ISBN: 364274804X ISBN-13(EAN): 9783642748042 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.
Автор: Nakasako Название: X-Ray Diffraction Imaging of Biological Cells ISBN: 4431566163 ISBN-13(EAN): 9784431566168 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
Описание: Proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987
Автор: Andr? Authier; Stefano Lagomarsino; Brian K. Tanne Название: X-Ray and Neutron Dynamical Diffraction ISBN: 1461376963 ISBN-13(EAN): 9781461376965 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996
Автор: Henning Friis Poulsen Название: Three-Dimensional X-Ray Diffraction Microscopy ISBN: 366214543X ISBN-13(EAN): 9783662145432 Издательство: Springer Рейтинг: Цена: 22359.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Описание: For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.
Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda Название: X-Ray Diffraction Crystallography ISBN: 3642442552 ISBN-13(EAN): 9783642442551 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
Автор: Reuben Rudman Название: Low-Temperature X-Ray Diffraction ISBN: 1461587735 ISBN-13(EAN): 9781461587736 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.
Автор: Oleg A. Glebov; Mikhail A. Krivoglaz Название: X-Ray and Neutron Diffraction in Nonideal Crystals ISBN: 3642742939 ISBN-13(EAN): 9783642742934 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.
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