Описание: This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films.
Автор: C. Suryanarayana; M. Grant Norton Название: X-Ray Diffraction ISBN: 1489901507 ISBN-13(EAN): 9781489901507 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a hands on approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Автор: Oleg A. Glebov; Mikhail A. Krivoglaz Название: X-Ray and Neutron Diffraction in Nonideal Crystals ISBN: 3642742939 ISBN-13(EAN): 9783642742934 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.
Автор: Kenneth William Andrews; David John Dyson; Samuel Название: Interpretation of Electron Diffraction Patterns ISBN: 148996228X ISBN-13(EAN): 9781489962287 Издательство: Springer Рейтинг: Цена: 11179.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Georg Will Название: Powder Diffraction ISBN: 3642066267 ISBN-13(EAN): 9783642066269 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures.
Автор: Henning Friis Poulsen Название: Three-Dimensional X-Ray Diffraction Microscopy ISBN: 366214543X ISBN-13(EAN): 9783662145432 Издательство: Springer Рейтинг: Цена: 22359.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Описание: For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.
Описание: Proceedings of the NATO Advanced Research Workshop, Oxford, U.K., 18-22 March, 1991
Автор: Ismail C. Noyan; Jerome B. Cohen Название: Residual Stress ISBN: 1461395712 ISBN-13(EAN): 9781461395713 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Reuben Rudman Название: Low-Temperature X-Ray Diffraction ISBN: 1461587735 ISBN-13(EAN): 9781461587736 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.
Автор: P.P. Ewald Название: Fifty Years of X-Ray Diffraction ISBN: 1461599636 ISBN-13(EAN): 9781461599630 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
