Handbook of Silicon Semiconductor Metrology, Diebold, Alain C.
Автор: Ferrero Название: Forensic Metrology ISBN: 3031146182 ISBN-13(EAN): 9783031146183 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers up-to-date information and guidance on the application of metrology in legal proceedings, clarifying the limits of validity of scientific evidence and presenting an illuminating series of case studies in which measurement uncertainty has played an important role. The fundamental concepts of metrology are discussed, and it is explained how metrology is capable of quantifying the reliability of measurement results and thereby contributing to appropriate decision making. With the aid of the presented case studies, this book will assist readers in understanding how legal decisions should be made in the presence of uncertainty. Areas covered in those studies include breath alcohol concentration analysis, and DNA profiling. Nowadays, decisions in most legal cases are based on evidence obtained through scientific analysis involving the acquisition of accurate measurements. Against this background, Forensic Metrology will be of value for lawyers and judges in both civil and common law countries, as well as engineers and other scientists with an interest in the subject.
Описание: This is a specialized book for researchers and technicians of universities and companies who are interested in the fundamentals of RF power semiconductors, their applications and market penetration.Looking around, we see that products using vacuum tube technology are disappearing.
Описание: This book discusses the theory of quantum effects used in metrology, and presents the author`s research findings in the field of quantum electronics.
Автор: Waldemar Nawrocki Название: Introduction to Quantum Metrology ISBN: 3319384791 ISBN-13(EAN): 9783319384795 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.
Автор: Yadav Название: Recent Advances in Metrology ISBN: 9811924678 ISBN-13(EAN): 9789811924675 Издательство: Springer Рейтинг: Цена: 32142.00 р. Наличие на складе: Поставка под заказ.
Описание: This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement.
Автор: Zhang, Song Название: Handbook of 3D Machine Vision ISBN: 1439872198 ISBN-13(EAN): 9781439872192 Издательство: Taylor&Francis Рейтинг: Цена: 31390.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Stephan Stuerwald Название: Digital Holographic Methods ISBN: 3030130878 ISBN-13(EAN): 9783030130879 Издательство: Springer Рейтинг: Цена: 12577.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser
Автор: Stephan Stuerwald Название: Digital Holographic Methods ISBN: 3030001687 ISBN-13(EAN): 9783030001681 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser
This book offers an in-depth discussion related to metrological aspects of automated tests. The accuracy of experimental estimates of test object performance is examined from the standpoint of their statistical variance and systematic biases.
The proposed metrological model of automated tests allows to determine the metrological characteristics of measurement means using data from their static and dynamic calibrations. Knowledge of these characteristics provides an ability to examine their impact on the accuracy of test results for the purposes of estimating statistical uncertainties caused by instrumentation errors and eliminating biases that occur as a consequence of inertial properties of measurement means.
Optimization of requirements for measurement errors to ensure a given accuracy of test results is discussed as well.
Proposed approaches and described methods are illustrated by test examples of turbomachinery products.
Автор: Waldemar Nawrocki Название: Introduction to Quantum Metrology ISBN: 3030196763 ISBN-13(EAN): 9783030196769 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency.The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia.This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.
Автор: Hassan Raza Название: Graphene Nanoelectronics ISBN: 3662519909 ISBN-13(EAN): 9783662519905 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Graphene Nanoelectronics provides an overview of the most advanced topics in theory, experiments, spectroscopy and applications of graphene and its nanostructures. It is written in tutorial, review-like manner, yielding a book useful to experts as well as those new to the field.
Описание: Plasma enhanced chemical vapor deposition (PECVD) is a technique widely accepted in microelectronics for the deposition of amorphous dielectric films such as silicon nitride and silicon oxide. Batch etching reactors and etching processes are approaching ma- turity after more than ten years of development.
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