Автор: Graham T. Smith Название: Industrial Metrology ISBN: 1849968780 ISBN-13(EAN): 9781849968782 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Поставка под заказ.
Описание: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications.
Описание: The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements.
Автор: Vosk Название: Forensic Metrology ISBN: 1439826196 ISBN-13(EAN): 9781439826195 Издательство: Taylor&Francis Рейтинг: Цена: 22202.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Forensic metrology is the application of scientific measurement to the investigation and prosecution of crime. Forensic measurements are relied upon to determine breath and blood alcohol and drug concentrations, weigh seized drugs, perform accident reconstruction, and for many other applications. Forensic metrology provides a basic framework for the performance and critical evaluation of all forensic measurements. It enables forensic scientists to better develop, perform and communicate forensic measurements; lawyers to better understand, present and cross-examine the results of forensic measurements; and judges to better subject testimony and evidence based on forensic measurements to the appropriate gatekeeping analysis. Forensic Metrology Scientific Measurement and Inference for Lawyers, Judges, and Criminalists sets forth the metrological framework required to reach sound conclusions based on measured results and the inferences those results support. Armed with this knowledge, scientists and nonscientists alike can: Engage in critical analysis of forensic measurements across a broad spectrum Better understand what measured results represent Successfully prepare and present testimony and/or cases that involve such evidence Recognize poor measurement practices and prevent bad science from undermining the search for truth in the courtroom The book begins by introducing and developing metrological principles and concepts. Next, it presents advanced and mathematically rigorous principles and methods of inference in metrology. Throughout the book, scientific and legal aspects of measurements are addressed and accompanied by examples. The accompanying CD includes an in-depth Primer on Forensic Metrology and provides practice materials for legal and forensic professionals that include court decisions, legal motions, and expert reports. A basic understanding of forensic metrology will improve the practices of both legal and forensic professionals, helping to ensure the integrity of the legal system, its fact-finding functions, and the practice of justice in the courtroom.
Автор: S. V. Gupta Название: Mass Metrology ISBN: 3030124649 ISBN-13(EAN): 9783030124649 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.
Автор: Diebold, Alain C. Название: Handbook of Silicon Semiconductor Metrology ISBN: 0824705068 ISBN-13(EAN): 9780824705060 Издательство: Taylor&Francis Рейтинг: Цена: 53592.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Fiorenzo Franceschini; Maurizio Galetto; Domenico Название: Distributed Large-Scale Dimensional Metrology ISBN: 1447158393 ISBN-13(EAN): 9781447158394 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The new idea of using WSNs for large-scale dimensional metrology has led to the design of distributed systems, subverting classic approaches and providing unique advantages such as portability and flexibility. This book explores the cutting edge in this field.
Автор: Hebra, Alexius J. Название: Physics of metrology ISBN: 3709116740 ISBN-13(EAN): 9783709116746 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Conceived as a reference manual for practicing engineers, instrument designers, service technicians and engineering students. Historical anecdotes as far back as Hellenistic times to modern scientists help illustrate in an entertaining manner ideas ranging from impractical inventions in history to those that have changed our lives.
Описание: This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Автор: Crowder Stephen, Delker Collin, Forrest Eric Название: Introduction to Statistics in Metrology ISBN: 303053331X ISBN-13(EAN): 9783030533311 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: 1. Introduction.- 2. Basic Concepts.- 3. The International System of Units (SI), Traceability, and Calibration.- 4. Introduction to Statistics and Probability.- 5. Measurement Uncertainty in Decision Making.- 6. The Measurement Model and Uncertainty.- 7. Analytical Methods for the Propagation of Uncertainties.- 8. Monte Carlo Methods for the Propagation of Uncertainties.- 9. Determining Uncertainties in Fitted Curves.- 10. Design of Experiments in Metrology.- 11. Special Topics in Metrology.- 12. Summary and Acknowledgments.
Автор: Wei Gao Название: Metrology ISBN: 9811049378 ISBN-13(EAN): 9789811049378 Издательство: Springer Рейтинг: Цена: 55901.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements.
This volume is part of a handbook series that covers a comprehensive range of scientific and technological matters in ‘Precision Manufacturing’.
Автор: Tom Proulx Название: Optical Measurements, Modeling, and Metrology, Volume 5 ISBN: 1461429056 ISBN-13(EAN): 9781461429050 Издательство: Springer Рейтинг: Цена: 36570.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
