Microscopy and Microanalysis for Lithium-Ion Batteries, Shen, Cai
Автор: A A Franco Название: Rechargeable Lithium Batteries ISBN: 1782420908 ISBN-13(EAN): 9781782420903 Издательство: Elsevier Science Рейтинг: Цена: 27454.00 р. Наличие на складе: Поставка под заказ.
Описание:
Rechargeable Lithium Batteries: From Fundamentals to Application provides an overview of rechargeable lithium batteries, from fundamental materials, though characterization and modeling, to applications. The market share of lithium ion batteries is fast increasing due to their high energy density and low maintenance requirements. Lithium air batteries have the potential for even higher energy densities, a requirement for the development of electric vehicles, and other types of rechargeable lithium battery are also in development.
After an introductory chapter providing an overview of the main scientific and technological challenges posed by rechargeable Li batteries, Part One of this book reviews materials and characterization of rechargeable lithium batteries. Part Two covers performance and applications, discussing essential aspects such as battery management, battery safety and emerging rechargeable lithium battery technologies as well as medical and aerospace applications.
Название: Electron and Ion Microscopy and Microanalysis ISBN: 0367402947 ISBN-13(EAN): 9780367402945 Издательство: Taylor&Francis Рейтинг: Цена: 10104.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Автор: Wladyslaw Wieczorek, Janusz P?ocharski Название: Designing Electrolytes for Lithium-Ion and Post-Lithium Batteries ISBN: 9814877166 ISBN-13(EAN): 9789814877169 Издательство: Taylor&Francis Рейтинг: Цена: 17762.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book fills this gap and shines more light on the role of electrolytes in modern batteries. Today, limitations in lithium-ion batteries result from non-optimal properties of commercial electrolytes as well as scientific and engineering challenges related to novel electrolytes for improved lithium-ion as well as future post-lithium batteries.
Автор: A M Skundin Название: All Solid State Thin-Film Lithium-Ion Batteries ISBN: 0367086824 ISBN-13(EAN): 9780367086824 Издательство: Taylor&Francis Рейтинг: Цена: 24499.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A comprehensive, accessible introduction to modern all-solid-state lithium-ion batteries.
Автор: Lin, Ming-fa Hsu, Wen-dung Huang, Jow-lay Название: Lithium-ion batteries and solar cells ISBN: 0367686236 ISBN-13(EAN): 9780367686239 Издательство: Taylor&Francis Рейтинг: Цена: 22202.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents a thorough investigation of diverse physical, chemical, and material properties and special functionalities of lithium ion batteries and solar cells. It covers theoretical simulations and high-resolution experimental measurements that promote a full understanding of the basic science to develop excellent device performance.
The 3rd International Multidisciplinary Microscopy Congress (InterM2015), held from 19 to 23 October 2015, focused on the latest developments concerning applications of microscopy in the biological, physical and chemical sciences at all dimensional scales, advances in instrumentation, techniques in and educational materials on microscopy. These proceedings gather 17 peer-reviewed technical papers submitted by leading academic and research institutions from nine countries and representing some of the most cutting-edge research available.
Автор: Jacobsen, Chris (argonne National Laboratory, Illinois) Название: Advances in microscopy and microanalysis ISBN: 1107076579 ISBN-13(EAN): 9781107076570 Издательство: Cambridge Academ Рейтинг: Цена: 20275.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.
Автор: E.K. Polychroniadis; Ahmet Yavuz Oral; Mehmet Ozer Название: 2nd International Multidisciplinary Microscopy and Microanalysis Congress ISBN: 3319169181 ISBN-13(EAN): 9783319169187 Издательство: Springer Рейтинг: Цена: 28734.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd International Multidisciplinary Microscopy and Microanalysis Congress & Exhibition (InterM 2014) was held on 16-19 October 2014 in Oludeniz, Fethiye/ Mugla, Turkey.The aim of the congress was to gather scientists from various branches and discuss the latest improvements in the field of microscopy.
Автор: Joseph I. Goldstein; Dale E. Newbury; Joseph R. Mi Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 1493982699 ISBN-13(EAN): 9781493982691 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Поставка под заказ.
Описание:
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a 'dual beam' platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.
Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relat
Автор: P.W. Hawkes; Ludwig Reimer Название: Scanning Electron Microscopy ISBN: 3642083722 ISBN-13(EAN): 9783642083723 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Автор: E.K. Polychroniadis; Ahmet Yavuz Oral; Mehmet Ozer Название: 2nd International Multidisciplinary Microscopy and Microanalysis Congress ISBN: 3319364405 ISBN-13(EAN): 9783319364407 Издательство: Springer Рейтинг: Цена: 22201.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd International Multidisciplinary Microscopy and Microanalysis Congress & Exhibition (InterM 2014) was held on 16-19 October 2014 in Oludeniz, Fethiye/ Mugla, Turkey.The aim of the congress was to gather scientists from various branches and discuss the latest improvements in the field of microscopy.
Описание: The 3rd International Multidisciplinary Microscopy Congress (InterM2015), held from 19 to 23 October 2015, focused on the latest developments concerning applications of microscopy in the biological, physical and chemical sciences at all dimensional scales, advances in instrumentation, techniques in and educational materials on microscopy.
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