Scanning Electron Microscopy and X-ray Microanalysis, Goldstein

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 10763 р.
Наличие на складе: Нет в наличии.

Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.

Автор: Kenichi Shimizu; Tomoaki Mitani
Название: New Horizons of Applied Scanning Electron Microscopy
ISBN: 3642031595 ISBN-13(EAN): 9783642031595
Издательство: Springer
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Цена: 19591 р.
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Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 14673 р.
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Автор: Zhong Lin Wang, Weilie Zhou
Название: Scanning microscopy for nanotechnology
ISBN: 0387333258 ISBN-13(EAN): 9780387333250
Издательство: Springer
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Цена: 26122 р.
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Описание: Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.