Coherent Light Microscopy, Pietro Ferraro; Adam Wax; Zeev Zalevsky

Автор: Sadewasser
Название: Kelvin Probe Force Microscopy
ISBN: 3642225659 ISBN-13(EAN): 9783642225659
Издательство: Springer
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Цена: 19591.00 р.
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Описание: Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Автор: Haugstad
Название: Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications
ISBN: 0470638826 ISBN-13(EAN): 9780470638828
Издательство: Wiley
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Цена: 20901.00 р.
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Описание: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 18284.00 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Автор: H.H. Kausch, H.G. Zachmann, G. Bodor, G. Elsner, J
Название: Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy (Advances in Polymer Science) (Volume 67)
ISBN: 366215966X ISBN-13(EAN): 9783662159668
Издательство: Springer
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Цена: 12157.00 р.
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Автор: Sascha Sadewasser; Thilo Glatzel
Название: Kelvin Probe Force Microscopy
ISBN: 3642271138 ISBN-13(EAN): 9783642271137
Издательство: Springer
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Цена: 16977.00 р.
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Описание: This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

Автор: Seizo Morita; Franz J. Giessibl; Roland Wiesendang
Название: Noncontact Atomic Force Microscopy
ISBN: 3642260705 ISBN-13(EAN): 9783642260704
Издательство: Springer
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Цена: 26120.00 р.
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Описание: This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.

Автор: George Turrell
Название: Raman Microscopy,
ISBN: 0121896900 ISBN-13(EAN): 9780121896904
Издательство: Elsevier Science
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Цена: 30212.00 р.
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Описание: Summarizes the Raman effect and discusses the hardware and software involved in the instruments. This book covers the important applications including those in materials science and earth science. It includes extensive description of the instrumentation, the Raman microspectrograph, the treatment of data, and micro-Raman imaging.