Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Автор: Shih-Lin In-Hang Название: Multiple Diffraction of X-Rays in Crystals ISBN: 3642821685 ISBN-13(EAN): 9783642821684 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg`s law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction.
Описание: This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films.
Описание: By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book.
Автор: Henning Friis Poulsen Название: Three-Dimensional X-Ray Diffraction Microscopy ISBN: 366214543X ISBN-13(EAN): 9783662145432 Издательство: Springer Рейтинг: Цена: 22359.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Автор: Hammond, Christopher Название: The Basics of Crystallography and Diffraction ISBN: 0198738684 ISBN-13(EAN): 9780198738688 Издательство: Oxford Academ Рейтинг: Цена: 8078.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Crystallography and diffraction are widely used throughout science for studying structure. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.
Автор: Oleg A. Glebov; Mikhail A. Krivoglaz Название: X-Ray and Neutron Diffraction in Nonideal Crystals ISBN: 3642742939 ISBN-13(EAN): 9783642742934 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.
Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G Название: X-Ray Diffraction by Disordered Lamellar Structures ISBN: 364274804X ISBN-13(EAN): 9783642748042 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.
Описание: For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.
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