Автор: Gongtian Shen; Zhanwen Wu; Junjiao Zhang Название: Advances in Acoustic Emission Technology ISBN: 1493912380 ISBN-13(EAN): 9781493912384 Издательство: Springer Рейтинг: Цена: 36570.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: "This volume includes the papers selected from the World Conference on Acoustic Emission--2013 (WCAE-2013) that was held on Oct. 30th-Nov. 2nd in Shanghai, China."--Page v.
Автор: Gongtian Shen; Zhanwen Wu; Junjiao Zhang Название: Advances in Acoustic Emission Technology ISBN: 3319290509 ISBN-13(EAN): 9783319290508 Издательство: Springer Рейтинг: Цена: 36570.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Part I: Keynote Lecture.- Progress of Acoustic Emission Technology on Pressure Equipment in China.- Part II: Instrumentation.- Advanced Usage of the Software Controlled Sensor Coupling Test.- A New Generation of AE System Based on PCI Express Bus.- Part III: Signal Processing and Analysis.- Localization of Acoustic Emissions in a Numerical T-shaped Concrete Beam using Multi-Segment Path Analysis.- Pattern Recognition for Acoustic Emission Signals of Offshore Platform T--Tube Damage Based on K-means Clustering.- Fault Analysis for Low Speed Heavy Duty Crane Slewing Bearing Based on Wavelet Energy Spectrum Coefficient.- Analysis of Fractional S transform.- Research of Tank Bottom Corrosion Acoustic Emission Simulation.- Extracting the Fault Feature of Acoustic Emission Signal Based on Kurtosis and Envelope Demodulation of the Wavelet Packet.- Research on the Diagnosis Method Based on the Waveform Streaming Signal of Rolling Bearing.- Part IV: Material Characteristics.- Acoustic Emission Behavior of 12MnNiVR under Corrosion.- B-value Characteristics of Rock Acoustic Emission under Impact Loading.- Evaluation of Acoustic Emission from damaged CFRP sheets for Air Industry Applications.- Acoustic Emission Study on Ti-Ni Shape Memory Alloy in Loading-unloading.- Glass Fiber Reinforce Plastic Composite Acoustic Emission Signal Detection and Source Localization.- Evaluating Freeze-Thaw Damage in Concrete with Acoustic Emissions and Ultrasonics.- Evaluation of Tensile Failure Progress in FRP using AE Tomography and Digital Image Correlation.- Assessment of Damage Evolution in Paper Material Based on Acoustic Emission: One Experimental and Statistical Method.- Innovative AE Measurement by Optical Fiber Sensing for FRP.- Fracturing Behaviors of Unfavorably Oriented Faults Investigated Using an Acoustic Emission Monitor.- Part V: Structure.- Investigation of Acoustic Emission Characteristics on Harbor Portal Crane.- Fatigue Failure Evaluation of RC Bridge Deck in Wheel Loading Test by AE Tomography.- The tests of node of railway steel bridge with use of Acoustic Emission method.- Evaluation of Deterioration of Concrete Due to Alkali-Aggregate Reaction Based on Through the Thickness Elastic Waves.- Assessing Deterioration of an In-field RC Bridge Deck by AE Tomography.- A Preliminary Study on Application of AE Methods to Detecting Aggregation Regions of RC Bridge Decks.- Acoustic emission testing of aluminum alloys pressure vessel.- Development of damage evaluation method for concrete in steel plate-bonded RC slabs.- Acoustic emission testing research of blowout preventer.- Part VI: Condition Monitoring and Diagnosis.- Acoustic emission testing of cryogenic pipelines in operating conditions.- Hit Based Acoustic Emission Monitoring of Rock Fractures: Challenges and Solutions.- Acoustic Emission Monitoring of Brittle Fatigue Crack Growth in Railway Steel.- Experimental Research on Acoustic Emission Monitoring for Dynamic Corrosion of the Simulated Tank Floor.- Part VII: Miscellaneous.- Study on the Influence Rule of Residual Stress on Ultrasonic Wave Propagation.
Автор: Sadewasser Название: Kelvin Probe Force Microscopy ISBN: 3642225659 ISBN-13(EAN): 9783642225659 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 0387258000 ISBN-13(EAN): 9780387258003 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
Автор: Andrew Briggs; Walter Arnold Название: Advances in Acoustic Microscopy ISBN: 1461376823 ISBN-13(EAN): 9781461376828 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This is the second volume of Advances in Acoustic Microscopy. Such applications can be thought of as bridging the gap be- tween acoustic microscopy at low gigahertz frequencies, and on the one hand nondestructive testing of materials at low megahertz frequencies and on the other hand medical ultrasonic imaging at low megahertz frequencies.
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
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