Описание: EMATs for Science and Industry comprises the physical principles of electromagnetic acoustic transducers (EMATs) and the applications to scientific and industrial ultrasonic measurements on materials. The text is arranged in four parts: -PART I is intended to be a self-contained description of the basic elements of coupling mechanism along with practical designing of EMATs for various purposes. There are several implementations to compensate for the low transfer efficiency of the EMATs. Useful tips to make an EMAT are also presented. -PART II describes the principle of electromagnetic acoustic resonance (EMAR), which makes the most of contactless nature of EMATs and is the most successful amplification mechanism for precise velocity and attenuation measurements. -PART III applies EMAR to studying the physical acoustics. New measurements emerged on three major subjects; in situ monitoring of dislocation behavior, determination of anisotropic elastic constants, and acoustic nonlinearity evolution. -PART IV deals with a variety of individual topics encountered in industrial applications, for which the EMATs are believed to the best solutions.The authors' work in this area has shown Electromagnetic acoustic resonance (EMAR) to be applicable not only to the acoustoelastic stress measurements, but also to many other nondestructive evaluation issues, including the determination of attenuation in solids. Noncontact measurement with high enough signal intensity was striking. Basic preconditions of theoretical approaches were realized by eliminating artifacts caused by the contact transducers. EMAR thus illuminated antiquated theories, which were accepted to be of little use or limited to qualitative interpretation of observations. It also uncovered interesting phenomena. Continuous monitoring of attenuation and acoustic nonlinearity resulted in the detection of ongoing microstructure evolutions in deforming or fatiguing metals.The aim of this book is to provide practical answers to the needs of ultrasonic measurements as well as an understanding of a novel methodology.
Описание: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).
Описание: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.
Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.
Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola Название: Noncontact Atomic Force Microscopy ISBN: 3319155873 ISBN-13(EAN): 9783319155876 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Noncontact Atomic Force Microscopy
Автор: Seizo Morita; Franz J. Giessibl; Roland Wiesendang Название: Noncontact Atomic Force Microscopy ISBN: 3642260705 ISBN-13(EAN): 9783642260704 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.
Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 1475793243 ISBN-13(EAN): 9781475793246 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 1475793278 ISBN-13(EAN): 9781475793277 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3 ISBN: 1475781849 ISBN-13(EAN): 9781475781847 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998.
Автор: Reifenberger Ronald G Название: Fundamentals Of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630357 ISBN-13(EAN): 9789814630351 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Автор: Reifenberger Ronald Название: Fundamentals of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630349 ISBN-13(EAN): 9789814630344 Издательство: World Scientific Publishing Рейтинг: Цена: 15048.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https: //nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
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