Автор: Adam Foster; Werner A. Hofer Название: Scanning Probe Microscopy ISBN: 1441923063 ISBN-13(EAN): 9781441923066 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
Автор: Zhong Lin Wang, Weilie Zhou Название: Scanning microscopy for nanotechnology ISBN: 0387333258 ISBN-13(EAN): 9780387333250 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat Название: Bringing Scanning Probe Microscopy up to Speed ISBN: 0792384660 ISBN-13(EAN): 9780792384663 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.
Автор: T. Sakurai; Y. Watanabe Название: Advances in Scanning Probe Microscopy ISBN: 3642630847 ISBN-13(EAN): 9783642630842 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland.
Автор: T. Sakurai; Y. Watanabe Название: Advances in Scanning Probe Microscopy ISBN: 3540667180 ISBN-13(EAN): 9783540667186 Издательство: Springer Рейтинг: Цена: 23058.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.
Автор: Weilie Zhou; Zhong Lin Wang Название: Scanning Microscopy for Nanotechnology ISBN: 1441922091 ISBN-13(EAN): 9781441922090 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Автор: P.W. Hawkes; Ludwig Reimer Название: Scanning Electron Microscopy ISBN: 3642083722 ISBN-13(EAN): 9783642083723 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Автор: R.G. Kessel; C.Y. Shih Название: Scanning Electron Microscopy in BIOLOGY ISBN: 3642808360 ISBN-13(EAN): 9783642808364 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Harald Fuchs; Bharat Bhushan Название: Biosystems - Investigated by Scanning Probe Microscopy ISBN: 3662519194 ISBN-13(EAN): 9783662519196 Издательство: Springer Рейтинг: Цена: 39182.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: All the essentials from the series Applied Scanning Probe Methods that relate to bio- and bio-related systems have here been combined in one volume to provide a comprehensive overview of SPM applications for biosystems, aimed at scientists and professionals.
Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
Автор: James Pawley; Heide Schatten Название: Biological Low-Voltage Scanning Electron Microscopy ISBN: 1489995846 ISBN-13(EAN): 9781489995841 Издательство: Springer Рейтинг: Цена: 23508.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This comprehensive volume is dedicated to the theory and practical applications of FESEM in biological samples. It provides a comprehensive explanation of instrumentation, applications, and protocols, to teach the reader how to obtain the best quality images.
Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie Название: Scanning Tunneling Microscopy I ISBN: 3642973450 ISBN-13(EAN): 9783642973451 Издательство: Springer Рейтинг: Цена: 11173.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment.
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