Автор: John B. Newkirk; Gavin R. Mallett; Heinz G. Pfeiff Название: Advances in X-ray Analysis ISBN: 1468486780 ISBN-13(EAN): 9781468486780 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-ray emission spectrography, while based on Moseley`s work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago.
Автор: John C. Russ Название: Advances in X-Ray Analysis ISBN: 1461399955 ISBN-13(EAN): 9781461399957 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif- fraction.
Автор: Rudolf Muller Название: Spectrochemical Analysis by X-Ray Fluorescence ISBN: 1468417991 ISBN-13(EAN): 9781468417999 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: For this reason theoretical investigations are used exclusively as a basis for practical work and the multitude of applications, which constitute the value of the x-ray fluores- cence method, will be explained on the basis of simple theory.
Автор: William M. Mueller; Gavin R. Mallett; Marie Fay Название: Advances in X-Ray Analysis ISBN: 146848639X ISBN-13(EAN): 9781468486391 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.
Автор: Charles Barrett Название: Advances in X-Ray Analysis ISBN: 1461399688 ISBN-13(EAN): 9781461399681 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.
Автор: Gregory J. McCarthy Название: Advances in X-Ray Analysis ISBN: 1461399890 ISBN-13(EAN): 9781461399896 Издательство: Springer Рейтинг: Цена: 13060.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In keeping with recent practice, this year`s Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.
Автор: Burton Henke Название: Advances in X-Ray Analysis ISBN: 1461399653 ISBN-13(EAN): 9781461399650 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy.
Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468474030 ISBN-13(EAN): 9781468474039 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com- munity, a versatility limited only by the imagination and inge- nuity of the scientist, the designer of X-ray equipment, and the novice or student.
Автор: William M. Mueller; Gavin Mallet; Marie Fay Название: Advances in X-Ray Analysis ISBN: 1468486756 ISBN-13(EAN): 9781468486759 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A real need exists for ways to bridge the gap between basic research and prac- tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish- ments to the civilian economy.
Автор: William M. Mueller; Marie Fay Название: Advances in X-Ray Analysis ISBN: 146848785X ISBN-13(EAN): 9781468487855 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: At the same time the researcher is faced with problems of in- creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest.
Автор: Charles S. Barrett; John B. Newkirk; Gavin R. Mall Название: Advances in X-Ray Analysis ISBN: 1468475371 ISBN-13(EAN): 9781468475371 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.
Автор: K. Heinrich Название: Advances in X-Ray Analysis ISBN: 1461399718 ISBN-13(EAN): 9781461399711 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.
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