Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468474030 ISBN-13(EAN): 9781468474039 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com- munity, a versatility limited only by the imagination and inge- nuity of the scientist, the designer of X-ray equipment, and the novice or student.
Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468476084 ISBN-13(EAN): 9781468476088 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.
Автор: Gavin R. Mallett; Marie Fay; William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468476351 ISBN-13(EAN): 9781468476354 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.
Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468486330 ISBN-13(EAN): 9781468486339 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Rudolf Muller Название: Spectrochemical Analysis by X-Ray Fluorescence ISBN: 1468417991 ISBN-13(EAN): 9781468417999 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: For this reason theoretical investigations are used exclusively as a basis for practical work and the multitude of applications, which constitute the value of the x-ray fluores- cence method, will be explained on the basis of simple theory.
Автор: S?rgio Luiz Morelh?o Название: Computer Simulation Tools for X-ray Analysis ISBN: 3319372963 ISBN-13(EAN): 9783319372969 Издательство: Springer Рейтинг: Цена: 9141.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research.
Автор: Charles Barrett Название: Advances in X-Ray Analysis ISBN: 1461399688 ISBN-13(EAN): 9781461399681 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.
Автор: Gregory J. McCarthy Название: Advances in X-Ray Analysis ISBN: 1461399890 ISBN-13(EAN): 9781461399896 Издательство: Springer Рейтинг: Цена: 13060.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In keeping with recent practice, this year`s Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.
Автор: William M. Mueller; Gavin R. Mallett; Marie Fay Название: Advances in X-Ray Analysis ISBN: 146848639X ISBN-13(EAN): 9781468486391 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.
Автор: John B. Newkirk; Gavin R. Mallett; Heinz G. Pfeiff Название: Advances in X-ray Analysis ISBN: 1468486780 ISBN-13(EAN): 9781468486780 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-ray emission spectrography, while based on Moseley`s work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago.
Автор: Burton Henke Название: Advances in X-Ray Analysis ISBN: 1461399653 ISBN-13(EAN): 9781461399650 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy.
Автор: Charles S. Barrett; John B. Newkirk; Gavin R. Mall Название: Advances in X-Ray Analysis ISBN: 1468475371 ISBN-13(EAN): 9781468475371 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.
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