Kelvin probe force microscopy, 

Автор: Sadewasser
Название: Kelvin Probe Force Microscopy
ISBN: 3642225659 ISBN-13(EAN): 9783642225659
Издательство: Springer
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Цена: 19591.00 р.
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Описание: Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Автор: Sascha Sadewasser; Thilo Glatzel
Название: Kelvin Probe Force Microscopy
ISBN: 3030092984 ISBN-13(EAN): 9783030092986
Издательство: Springer
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Цена: 27950.00 р.
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Описание: This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

Автор: Sascha Sadewasser; Thilo Glatzel
Название: Kelvin Probe Force Microscopy
ISBN: 3642271138 ISBN-13(EAN): 9783642271137
Издательство: Springer
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Цена: 16977.00 р.
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Описание: This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

Автор: Adam Foster; Werner A. Hofer
Название: Scanning Probe Microscopy
ISBN: 1441923063 ISBN-13(EAN): 9781441923066
Издательство: Springer
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Цена: 19589.00 р.
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Описание: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat
Название: Bringing Scanning Probe Microscopy up to Speed
ISBN: 1461373530 ISBN-13(EAN): 9781461373537
Издательство: Springer
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Цена: 13974.00 р.
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Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 3662506017 ISBN-13(EAN): 9783662506011
Издательство: Springer
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Цена: 28732.00 р.
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Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat
Название: Bringing Scanning Probe Microscopy up to Speed
ISBN: 0792384660 ISBN-13(EAN): 9780792384663
Издательство: Springer
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Цена: 20962.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.