Optical Characterization of Thin Solid Films, Olaf Stenzel; Miloslav Ohl?dal
Автор: Olaf Stenzel; Miloslav Ohl?dal Название: Optical Characterization of Thin Solid Films ISBN: 3030092003 ISBN-13(EAN): 9783030092009 Издательство: Springer Рейтинг: Цена: 12577.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Описание: Symposium K and Symposium RR were held April 21-25 at the 2014 MRS Spring Meeting. This symposium proceedings volume represents the recent advances in various areas of deposition, processing, characterization and integration of functional oxide materials, with particular emphasis on the relationship among the structure, composition, stability and functional properties.
Автор: Manuel P. Soriaga; John Stickney; Lawrence A. Bott Название: Thin Films: Preparation, Characterization, Applications ISBN: 1461352339 ISBN-13(EAN): 9781461352334 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is about thin films; The chapters in this volume are based on invited papers presented by prominent researchers in the field at a Symposium on "Thin Films: Preparation, Characterization, Applications" at the 221st National Meeting of the American Chemical Society held in San Diego, California.
Описание: Recent progress in ICT has exceeded our expectations for meeting the requirement of multimedia society in the 21st century. The FSOC is considered to be one of the key technologies for realizing very high speed multi GbPs large-capacity terrestrial and aerospace communications. In FSOC, the optical beam propagation in the turbulent atmosphere is severely affected by various factors suspended in the channel. Wavefront aberration correcting with continuous beam alignment are the key requirements for a successful installation of an FSOC system which are the main contributions in our book. Establishment of FSOC setups, development of accurate weather station, measurement of atmospheric attenuation (Att) and turbulence strength (Cn2), development of new models to predict the Att and Cn2, design of Response Surface Model and Artificial Neural Network based on controller, implementation of neural-controller in FPGA and attaining the BER of 6.4x10^-9 during different outdoor environments. All the original contributions, newness, findings and experimental results etc., are reported in the book. Subject of work; Wireless Optical Communication. The content of the book can be referred by various application designers and/or academicians for working on FSOC transceiver design, laser cutting, laser metrology, laser surgery, beam focusing & pointing, beacon positioning and coupling etc. Further, all necessary MATLAB and VHDL codes are also given on appropriate pages for the readers' quick/ clear understanding.
Автор: G?nther Bauer; Wolfgang Richter Название: Optical Characterization of Epitaxial Semiconductor Layers ISBN: 364279680X ISBN-13(EAN): 9783642796807 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade.
Описание: The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.
Автор: Alejandro C?mara Название: Optical Beam Characterization via Phase-Space Tomography ISBN: 331919979X ISBN-13(EAN): 9783319199795 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book describes several non-interferometric methods based on phase-space tomography for recovering the spatial coherence information of optical beams.In the context of optical beams, partially coherent light provides numerous advantages over coherent light.
Автор: Alejandro C?mara Название: Optical Beam Characterization via Phase-Space Tomography ISBN: 3319369873 ISBN-13(EAN): 9783319369877 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book describes several non-interferometric methods based on phase-space tomography for recovering the spatial coherence information of optical beams.In the context of optical beams, partially coherent light provides numerous advantages over coherent light.
Автор: D. Dragoman; M. Dragoman Название: Optical Characterization of Solids ISBN: 3642075215 ISBN-13(EAN): 9783642075216 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Gives a comprehensive and coherent account of the basic methods to characterize a solid through its interaction with an electromagnetic field.
Описание: This book demonstrates the implementation of an automated measuring system for very efficient measurement of chromatic dispersion, which uses a modulation phase shift method over long haul of optical single mode fiber. The authors show how a new scheme for measuring chromatic dispersion is adopted in conjunction with a tunable laser (TLS), providing the optical power at required wavelength and digital oscilloscope (DOSC) for measuring the phase difference between microwave signals from transmitter and microwave signals at the receiver. This is a novel approach for real-time chromatic dispersion in optical systems such as optical fibers. The setup used is very simple, accurate and cost effective, compared to other methods such as direct measurement, differential mode delay, polarization mode dispersion measurement and phase delay method.
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