Автор: Dimitry N. Frolov Название: Microscope Design: Volume 1: Principles ISBN: 1510639934 ISBN-13(EAN): 9781510639935 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 13814.00 р. Наличие на складе: Нет в наличии.
Описание: Traces the historical development of microscopy instruments from their invention to the current state of the art. New concepts and engineering solutions are presented for modern light microscopes, with a focus on the practical construction of optical systems. Real design parameters of dioptric objectives and other systems are provided.
Автор: Hiroyasu Saka Название: Practical Electron Microscopy Of Lattice Defects ISBN: 9811234698 ISBN-13(EAN): 9789811234699 Издательство: World Scientific Publishing Рейтинг: Цена: 15840.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: 'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]
Ultramicroscopy
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Описание: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
Автор: Kirkland Angus I, Moldovan Grigore Название: Digital Imaging Detectors For Electron Microscopy ISBN: 1848162855 ISBN-13(EAN): 9781848162853 Издательство: World Scientific Publishing Рейтинг: Цена: 8870.00 р. Наличие на складе: Поставка под заказ.
Описание: Electron microscopes are used in most investigation methods in materials science and are key players in the rise of nanotechnology. This book discusses theoretical, technological and functional aspects of electron detectors. It is suitable for researchers in electron microscopy.
Автор: Anna Rita Bizzarri, Salvatore Cannistraro Название: Dynamic Force Spectroscopy and Biomolecular Recognition ISBN: 1138374520 ISBN-13(EAN): 9781138374522 Издательство: Taylor&Francis Рейтинг: Цена: 9492.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Molecular recognition, also known as biorecognition, is the heart of all biological interactions. Originating from protein stretching experiments, dynamic force spectroscopy (DFS) allows for the extraction of detailed information on the unbinding process of biomolecular complexes. It is becoming progressively more important in biochemical studies and is finding wider applications in areas such as biophysics and polymer science. In six chapters, Dynamic Force Spectroscopy and Biomolecular Recognition covers the most recent ideas and advances in the field of DFS applied to biorecognition: Chapter 1: Reviews the basic and novel aspects of biorecognition and discusses the emerging capabilities of single-molecule techniques to disclose kinetic properties and molecular mechanisms usually hidden in bulk measurements Chapter 2: Describes the basic principle of atomic force microsocopy (AFM) and DFS, with particular attention to instrumental and theoretical aspects more strictly related to the study of biomolecules Chapter 3: Overviews the theoretical background in which experimental data taken in nonequilibrum measurements of biomolecular unbinding forces are extrapolated to equilibrium conditions Chapter 4: Reviews the most common and efficient strategies adopted in DFS experiments to immobilize the interacting biomolecules to the AFM tip and to the substrate Chapter 5: Presents and discusses the most representative aspects related to the analysis of DFS data and the challenges of integrating well-defined criteria to calibrate data in automatic routinary procedures Chapter 6: Overviews the most relevant DFS applications to study biorecognition processes, including the biotin/avidin pair, and selected results on various biological complexes, including antigen/antibody, proteins/DNA, and complexes involved in adhesion processes Chapter 7: Summarizes the main results obtained by DFS applied to study biorecognition processes with forthcoming theoretical and experimental advances Although DFS is a widespread, worldwide technique, no books focused on this subject have been available until now. Dynamic Force Spectroscopy and Biomolecular Recognition provides the state of the art of experimental data analysis and theoretical procedures, making it a useful tool for researchers applying DFS to study biorecognition processes.
This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.
Автор: Gong Shanghai Jiao Tong University Press Название: Advances in Nanophotonics ISBN: 3110304317 ISBN-13(EAN): 9783110304312 Издательство: Walter de Gruyter Цена: 22305.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Presents recent developments in theoretical and experimental research of nanophotonics
Discusses properties and features of nanophotonic devices, e.g. scanning near-field optical microscopy, nanofi ber/nanowire based photonic devices
Illustrates the most promising nanophotonic devices and instruments and their application
Suits well for researchers and graduates in nanophotonics field
Contents Scanning near-field optical microscopy Nanofibers/nanowires and their applications in photonic components and devices Micro/nano-optoelectronic devices based on photonic crystal
Автор: Da Xing, Zhihong Zhang, Yong Deng, Zhenli Huang, L Название: Advances in Molecular Biophotonics ISBN: 3110304384 ISBN-13(EAN): 9783110304381 Издательство: Walter de Gruyter Рейтинг: Цена: 22305.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Presents recent developments and application of fluorescent protein-labelling techniques and two-photon molecular probes.
Introduces the theoretical and experimental researches of super-resolution localization microscopy, photoacoustic molecular (functional) imaging, and optical molecular tomography for small animal in vivo.
Illustrates optical labeling techniques and imaging instruments and their application in biological studies.
Suits well for researchers and graduates in biomolecular photonics fields.
Автор: Bonnell Dawn A Название: Scanning Probe Microscopy for Energy Research ISBN: 9814434701 ISBN-13(EAN): 9789814434706 Издательство: World Scientific Publishing Рейтинг: Цена: 31680.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Автор: P. W. Hawkes; J. Frank; P.W. Hawkes; R. Hegerl; W. Название: Computer Processing of Electron Microscope Images ISBN: 3642813836 ISBN-13(EAN): 9783642813832 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper- imental difficulty;
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