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Highly Integrated Gate Drivers for Si and Gan Power Transistors, Seidel Achim, Wicht Bernhard


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Автор: Seidel Achim, Wicht Bernhard
Название:  Highly Integrated Gate Drivers for Si and Gan Power Transistors
ISBN: 9783030689391
Издательство: Springer
Классификация:

ISBN-10: 3030689395
Обложка/Формат: Hardcover
Страницы: 124
Вес: 0.38 кг.
Дата издания: 04.05.2021
Язык: English
Размер: 23.39 x 15.60 x 0.97 cm
Ссылка на Издательство: Link
Поставляется из: Германии
Описание: The authors cover the full range from fundamentals to implementation details including topics like power stages, various kinds of gate drivers (resonant, non-resonant, current-source, voltage-source), gate drive schemes, driver supply, gate loop, gate driver power efficiency and comparison silicon versus GaN transistors.


Dynamic Performance Simulation of AlGaN/GaN High Electron Mobility Transistors

Автор: Mukherjee Shrijit
Название: Dynamic Performance Simulation of AlGaN/GaN High Electron Mobility Transistors
ISBN: 0530005883 ISBN-13(EAN): 9780530005881
Издательство: Неизвестно
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Цена: 12139.00 р.
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Описание: Abstract:

GaN based devices have reached a point in terms of processing maturity where the favorable wide-band gap related properties can be implemented in several commercial and military applications. However, long term reliability continues to affect large scale integration of such devices, specifically the potential of AlGaN/GaN High Electron Mobility Transistors (HEMTs), due to the indefinite nature of defects in the structure and mechanisms of performance degradation relevant to such defects.

Recent efforts have begun to concentrate more on the bulk properties of the GaN buffer on which the heterostructure is grown, and how defects distributed in the buffer can affect the performance under various operating schemes. This dissertation discusses numerical simulator based investigation of the numerous possibilities by which such point defects can affect electrical behavior. For HEMTs designed for satellite communication systems, proton irradiation results indicate changes in the device parasitics resulting in degradation of RF parameters. Assumption of such radiation damage introducing fast traps indicate severe degradation far exceeding experimental observation. For power switching applications, the necessity of accurately capturing as-grown defects was realized when modeling current relaxation during bias switching. Ability to introduce multiple trap levels in the material bulk aided in achieving simulation results replicating experimental results more accurately than published previously. Impact of factors associated with such traps, either associated with discrete energy levels or band-like distribution in energy, on the nature of current relaxation characterized by its derivative has been presented.

Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Dynamic Performance Simulation of AlGaN/GaN High Electron Mobility Transistors" by Shrijit Mukherjee, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

Lateral Power Transistors in Integrated Circuits

Автор: Tobias Erlbacher
Название: Lateral Power Transistors in Integrated Circuits
ISBN: 3319004999 ISBN-13(EAN): 9783319004990
Издательство: Springer
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Цена: 19564.00 р.
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Описание: This book details and compares recent advancements in the development of novel lateral power transistors (LDMOS devices) for integrated circuits in power electronic applications. It includes the state-of-the-art concept of double-acting RESURF topologies.

Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond

Автор: Saha Samar K.
Название: Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond
ISBN: 1482240661 ISBN-13(EAN): 9781482240665
Издательство: Taylor&Francis
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Цена: 31390.00 р.
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Описание: This modern treatise on compact models for circuit computer-aided design (CAD) presents industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor (MOS) field-effect-transistors (FETs), FinFETs, and tunnel field-effect transistors (TFETs), along with statistical MOS models.

Short-Channel Organic Thin-Film Transistors

Автор: Tarek Zaki
Название: Short-Channel Organic Thin-Film Transistors
ISBN: 3319369806 ISBN-13(EAN): 9783319369808
Издательство: Springer
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Цена: 13059.00 р.
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Описание: This work takes advantage of high-resolution silicon stencil masks to build air-stable complementary OTFTs using a low-temperature fabrication process. the masks exhibit excellent stiffness and stability, thus allowing OTFTs with submicrometer channel lengths and superb device uniformity to be patterned.

Investigation of Gate Current in Neutron Irradiated Alxga1-Xn/Gan Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence

Автор: Gray Thomas E.
Название: Investigation of Gate Current in Neutron Irradiated Alxga1-Xn/Gan Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence
ISBN: 1288308345 ISBN-13(EAN): 9781288308347
Издательство: Неизвестно
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Цена: 10658.00 р.
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Electricity Generation Using Wind Power (Second Edition)

Автор: Shepherd William Et Al
Название: Electricity Generation Using Wind Power (Second Edition)
ISBN: 9813148659 ISBN-13(EAN): 9789813148659
Издательство: World Scientific Publishing
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Цена: 15048.00 р.
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Описание:

Is wind power the answer to our energy supply problems? Is there enough wind for everyone? Is offshore generation better than onshore generation? Can a roof-mounted wind turbine generate enough electricity to supply a typical domestic household?

Electricity Generation Using Wind Power (2nd Edition) answers these pressing questions through its detailed coverage of the different types of electrical generator machines used, as well as the power electronic converter technologies and control principles employed. Also covered is the integration of wind farms into established electricity grid systems, plus environmental and economic aspects of wind generation.

Written for technically minded readers, especially electrical engineers concerned with the possible use of wind power for generating electricity, it incorporates some global meteorological and geographical features of wind supply plus a survey of past and present wind turbines. Included is a technical assessment of the choice of turbine sites. The principles and analysis of wind power conversion, transmission and efficiency evaluation are described.

This book includes worked numerical examples in some chapters, plus end of chapter problems and review questions, with answers. As a textbook it is pitched at the level of final year undergraduate engineering study but may also be useful as a textbook or reference for wider technical studies.

Sensitivity Analysis of Algan/Gan High Electron Mobility Transistors to Process Variation

Автор: Liddle Adam J.
Название: Sensitivity Analysis of Algan/Gan High Electron Mobility Transistors to Process Variation
ISBN: 1249834252 ISBN-13(EAN): 9781249834250
Издательство: Неизвестно
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Цена: 10658.00 р.
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Temperature Dependent Current-Voltage Measurements of Neutron Irradiated Al0.27ga0.73n/Gan Modulation Doped Field Effect Transistors

Автор: Uhlman Troy A.
Название: Temperature Dependent Current-Voltage Measurements of Neutron Irradiated Al0.27ga0.73n/Gan Modulation Doped Field Effect Transistors
ISBN: 1249836565 ISBN-13(EAN): 9781249836568
Издательство: Неизвестно
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Цена: 10658.00 р.
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An Analysis of the Effects of Low Energy Electron Radiation on A1xga1-Xn/Gan Modulation-Doped Field-Effect Transistors

Автор: Sattler James M.
Название: An Analysis of the Effects of Low Energy Electron Radiation on A1xga1-Xn/Gan Modulation-Doped Field-Effect Transistors
ISBN: 1286861640 ISBN-13(EAN): 9781286861646
Издательство: Неизвестно
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Цена: 10658.00 р.
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Lateral Power Transistors in Integrated Circuits

Автор: Tobias Erlbacher
Название: Lateral Power Transistors in Integrated Circuits
ISBN: 3319345206 ISBN-13(EAN): 9783319345208
Издательство: Springer
Рейтинг:
Цена: 14365.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book details and compares recent advancements in the development of novel lateral power transistors (LDMOS devices) for integrated circuits in power electronic applications. It includes the state-of-the-art concept of double-acting RESURF topologies.

Semiconducting Metal Oxide Thin-Film Transistors

Автор: Ye Zhou
Название: Semiconducting Metal Oxide Thin-Film Transistors
ISBN: 0750325542 ISBN-13(EAN): 9780750325547
Издательство: INGRAM PUBLISHER SERVICES UK
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Цена: 25344.00 р.
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Описание: Patrick McGorry has transformed the lives of thousands of young people through early intervention and a holistic approach to mental health care. Here, he presents his plan for mental wealth for all Australians - he wants to ensure that all Australians have every chance for a fulfilling and mentally healthy life, crucially supported by stigma-free access to humane and effective mental health care.

Advanced Simulation  Methods For Gallium Nitride Electronic Devices: An accurate analysis of  state-of-the-art high-frequency and high-power Gallium Nitride High   Electron Mobility Transistors

Автор: Fabio Alessio Marino
Название: Advanced Simulation Methods For Gallium Nitride Electronic Devices: An accurate analysis of state-of-the-art high-frequency and high-power Gallium Nitride High Electron Mobility Transistors
ISBN: 363931929X ISBN-13(EAN): 9783639319293
Издательство: LAP LAMBERT Academic Publishing
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Цена: 4575.00 р.
Наличие на складе: Нет в наличии.


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