Mitigating Process Variability and Soft Errors at Circuit-Level for Finfets, Zimpeck Alexandra, Meinhardt Cristina, Artola Laurent
Автор: Jian Cheng Zhang; M.A. Styblinski Название: Yield and Variability Optimization of Integrated Circuits ISBN: 146135935X ISBN-13(EAN): 9781461359357 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.
Описание: This book describes the state-of-the art of industrial and academic research in the architectural design of heterogeneous, multi/many-core processors.
Автор: J.-P. Colinge Название: FinFETs and Other Multi-Gate Transistors ISBN: 1441944095 ISBN-13(EAN): 9781441944092 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains the physics and properties of multi-gate field-effect transistors (MuGFETs), how they are made and how circuit designers can use them to improve the performances of integrated circuits.
Описание: transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells.
Автор: Jiann-Shiun Yuan Название: CMOS RF Circuit Design for Reliability and Variability ISBN: 9811008825 ISBN-13(EAN): 9789811008825 Издательство: Springer Рейтинг: Цена: 8489.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.
Описание: This book describes the state-of-the art of industrial and academic research in the architectural design of heterogeneous, multi/many-core processors. The authors describe methods and tools to enable next-generation embedded and high-performance heterogeneous processors to confront cost-effectively the inevitable variations by providing Dependable-Performance: correct functionality and timing guarantees throughout the expected lifetime of a platform under thermal, power, and energy constraints. Various aspects of the reliability problem are discussed, at both the circuit and architecture level, the intelligent selection of knobs and monitors in multicore platforms, and systematic design methodologies. The authors demonstrate how new techniques have been applied in real case studies from different applications domain and report on results and conclusions of those experiments. Enables readers to develop performance-dependable heterogeneous multi/many-core architectures Describes system software designs that support high performance dependability requirements Discusses and analyzes low level methodologies to tradeoff conflicting metrics, i.e. power, performance, reliability and thermal management Includes new application design guidelines to improve performance dependability
Автор: Jian Cheng Zhang; M.A. Styblinski Название: Yield and Variability Optimization of Integrated Circuits ISBN: 0792395514 ISBN-13(EAN): 9780792395515 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers.
Описание: This book focuses on computing devices and their design at various levels to combat variability. These can be combined in various ways to achieve specific goals related to observability and controllability of the variability effects, providing means to achieve cross layer or hybrid resilience.
Автор: Gustavo Neuberger; Gilson Wirth; Ricardo Reis Название: Protecting Chips Against Hold Time Violations Due to Variability ISBN: 9401777942 ISBN-13(EAN): 9789401777940 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Novel `very deep sub-micron` technologies in digital circuit manufacture have raised the profile of process variability as an issue. This volume focuses on storage elements and examines the consequences of variability in several aspects of circuit design.
Описание: This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
