Yield and Variability Optimization of Integrated Circuits, Jian Cheng Zhang; M.A. Styblinski
Автор: Gustavo Neuberger; Gilson Wirth; Ricardo Reis Название: Protecting Chips Against Hold Time Violations Due to Variability ISBN: 9401777942 ISBN-13(EAN): 9789401777940 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Novel `very deep sub-micron` technologies in digital circuit manufacture have raised the profile of process variability as an issue. This volume focuses on storage elements and examines the consequences of variability in several aspects of circuit design.
Автор: Jiann-Shiun Yuan Название: CMOS RF Circuit Design for Reliability and Variability ISBN: 9811008825 ISBN-13(EAN): 9789811008825 Издательство: Springer Рейтинг: Цена: 8489.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.
Автор: D.M. Walker Название: Yield Simulation for Integrated Circuits ISBN: 0898382440 ISBN-13(EAN): 9780898382440 Издательство: Springer Рейтинг: Цена: 23751.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator.
Автор: Stephen W. Director; Wojciech Maly; Andrzej J. Str Название: VLSI Design for Manufacturing: Yield Enhancement ISBN: 1461288169 ISBN-13(EAN): 9781461288169 Издательство: Springer Рейтинг: Цена: 11753.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance.
Автор: Jitendra B. Khare; Wojciech Maly Название: From Contamination to Defects, Faults and Yield Loss ISBN: 0792397142 ISBN-13(EAN): 9780792397144 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Автор: Jitendra B. Khare; Wojciech Maly Название: From Contamination to Defects, Faults and Yield Loss ISBN: 146128595X ISBN-13(EAN): 9781461285953 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Описание: As well as explaining how to integrate chip optimizations in powerful new ways, this comprehensive introduction to physical synthesis takes the reader methodically from first principles to state-of-the-art optimizations used in cutting-edge industrial tools.
Автор: K. Antreich; R. Bulirsch; A. Gilg; P. Rentrop Название: Modeling, Simulation, and Optimization of Integrated Circuits ISBN: 3034894260 ISBN-13(EAN): 9783034894265 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
In November 2001 the Mathematical Research Center at Oberwolfach, Germany, hosted the third Conference on Mathematical Models and Numerical Simulation in Electronic Industry. It brought together researchers in mathematics, electrical engineering and scientists working in industry.
The contributions to this volume try to bridge the gap between basic and applied mathematics, research in electrical engineering and the needs of industry.
Автор: Stephen W. Director; Wojciech Maly; Andrzej J. Str Название: VLSI Design for Manufacturing: Yield Enhancement ISBN: 0792390547 ISBN-13(EAN): 9780792390541 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance.
Описание: Constitutes the proceedings of the 17th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2007, held in Gothenburg, Sweden, in September 2007. This work contains papers organized in topical sections on high-level design, low power design techniques, low power analog circuits and low power applications.
Автор: Jian Cheng Zhang; M.A. Styblinski Название: Yield and Variability Optimization of Integrated Circuits ISBN: 0792395514 ISBN-13(EAN): 9780792395515 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers.
Описание: Constituting the proceedings of the 12th International Workshop on Power and Timing Modeling, Optimization and Simulation, 2002, the papers have been organized into topical sections including: arithmetics; low-level modelling and characterization; asynchronous and adiabatic techniques.
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