Power transmission system analysis against faults and attacks, Tamalika Chowdhury, Abhijit Chakrabarti, Chandan Kumar Chanda
Автор: Mangard Название: Power Analysis Attacks ISBN: 0387308571 ISBN-13(EAN): 9780387308579 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Power analysis attacks allow the extraction of secret information from smart cards. In all these applications, the security of the smart cards is of crucial importance. Power Analysis Attacks: Revealing the Secrets of Smart Cards is the first comprehensive treatment of power analysis attacks and countermeasures.
Автор: Das Название: Power System Analysis ISBN: 1138075043 ISBN-13(EAN): 9781138075047 Издательство: Taylor&Francis Рейтинг: Цена: 16078.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Fundamental to the planning, design, and operating stages of any electrical engineering endeavor, power system analysis continues to be shaped by dramatic advances and improvements that reflect today's changing energy needs. Highlighting the latest directions in the field, Power System Analysis: Short-Circuit Load Flow and Harmonics, Second Edition includes investigations into arc flash hazard analysis and its migration in electrical systems, as well as wind power generation and its integration into utility systems.
Designed to illustrate the practical application of power system analysis to real-world problems, this book provides detailed descriptions and models of major electrical equipment, such as transformers, generators, motors, transmission lines, and power cables. With 22 chapters and 7 appendices that feature new figures and mathematical equations, coverage includes:
Short-circuit analyses, symmetrical components, unsymmetrical faults, and matrix methods
Rating structures of breakers
Current interruption in AC circuits, and short-circuiting of rotating machines
Calculations according to the new IEC and ANSI/IEEE standards and methodologies
Load flow, transmission lines and cables, and reactive power flow and control
Techniques of optimization, FACT controllers, three-phase load flow, and optimal power flow
A step-by-step guide to harmonic generation and related analyses, effects, limits, and mitigation, as well as new converter topologies and practical harmonic passive filter designs--with examples
More than 2000 equations and figures, as well as solved examples, cases studies, problems, and references
Maintaining the structure, organization, and simplified language of the first edition, longtime power system engineer J.C. Das seamlessly melds coverage of theory and practical applications to explore the most commonly required short-circuit, load-flow, and harmonic analyses. This book requires only a beginning knowledge of the per-unit system, electrical circuits and machinery, and matrices, and it offers significant updates and additional information, enhancing technical content and presentation of subject matter. As an instructional tool for computer simulation, it uses numerous examples and problems to present new insights while making readers comfortable with procedure and methodology.
Описание: Accurate, fast, and reliable fault classification techniques are an important operational requirement in modern-day power transmission systems. This book gives an elaboration of the power system faults and the conventional techniques of fault analysis.
Автор: S. Jayanthy; M.C. Bhuvaneswari Название: Test Generation of Crosstalk Delay Faults in VLSI Circuits ISBN: 9811347840 ISBN-13(EAN): 9789811347849 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Автор: S. Jayanthy; M.C. Bhuvaneswari Название: Test Generation of Crosstalk Delay Faults in VLSI Circuits ISBN: 9811324921 ISBN-13(EAN): 9789811324925 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Автор: Jitendra B. Khare; Wojciech Maly Название: From Contamination to Defects, Faults and Yield Loss ISBN: 146128595X ISBN-13(EAN): 9781461285953 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Автор: Ireneusz Mrozek Название: Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 3030081982 ISBN-13(EAN): 9783030081980 Издательство: Springer Рейтинг: Цена: 12577.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.
Описание: This book describes fault tolerance techniques based on software and hardware to create hybrid techniques. The authors then discuss the best trade-off between software-based and hardware-based techniques and introduce novel hybrid techniques.
Описание: This book illuminates how synchrophasors achieve the monitoring, protection and control optimizations necessary to expand existing power systems to support increasing amounts of renewable and distributed energy resources.
Автор: Gonen Turan Название: Electrical Power Transmission System Engineering ISBN: 1482232227 ISBN-13(EAN): 9781482232226 Издательство: Taylor&Francis Рейтинг: Цена: 7920.00 р. Наличие на складе: Поставка под заказ.
Описание:
Electrical Power Transmission System Engineering: Analysis and Design is devoted to the exploration and explanation of modern power transmission engineering theory and practice. Designed for senior-level undergraduate and beginning-level graduate students, the book serves as a text for a two-semester course or, by judicious selection, the material may be condensed into one semester. Written to promote hands-on self-study, it also makes an ideal reference for practicing engineers in the electric power utility industry.
Basic material is explained carefully, clearly, and in detail, with multiple examples. Each new term is defined as it is introduced. Ample equations and homework problems reinforce the information presented in each chapter. A special effort is made to familiarize the reader with the vocabulary and symbols used by the industry. Plus, the addition of numerous impedance tables for overhead lines, transformers, and underground cables makes the text self-contained.
The Third Edition is not only up to date with the latest advancements in electrical power transmission system engineering, but also:
Provides a detailed discussion of flexible alternating current (AC) transmission systems
Offers expanded coverage of the structures, equipment, and environmental impacts of transmission lines
Features additional examples of shunt fault analysis using MATLAB(R)
Also included is a review of the methods for allocating transmission line fixed charges among joint users, new trends and regulations in transmission line construction, a guide to the Federal Energy Regulatory Commission (FERC) electric transmission facilities permit process and Order No. 1000, and an extensive glossary of transmission system engineering terminology.
Covering the electrical and mechanical aspects of the field with equal detail, Electrical Power Transmission System Engineering: Analysis and Design, Third Edition supplies a solid understanding of transmission system engineering today.
Автор: Jitendra B. Khare; Wojciech Maly Название: From Contamination to Defects, Faults and Yield Loss ISBN: 0792397142 ISBN-13(EAN): 9780792397144 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Автор: Mrozek Название: Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 3319912038 ISBN-13(EAN): 9783319912035 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail.
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