Описание: Recent progress in ICT has exceeded our expectations for meeting the requirement of multimedia society in the 21st century. The FSOC is considered to be one of the key technologies for realizing very high speed multi GbPs large-capacity terrestrial and aerospace communications. In FSOC, the optical beam propagation in the turbulent atmosphere is severely affected by various factors suspended in the channel. Wavefront aberration correcting with continuous beam alignment are the key requirements for a successful installation of an FSOC system which are the main contributions in our book. Establishment of FSOC setups, development of accurate weather station, measurement of atmospheric attenuation (Att) and turbulence strength (Cn2), development of new models to predict the Att and Cn2, design of Response Surface Model and Artificial Neural Network based on controller, implementation of neural-controller in FPGA and attaining the BER of 6.4x10^-9 during different outdoor environments. All the original contributions, newness, findings and experimental results etc., are reported in the book. Subject of work; Wireless Optical Communication. The content of the book can be referred by various application designers and/or academicians for working on FSOC transceiver design, laser cutting, laser metrology, laser surgery, beam focusing & pointing, beacon positioning and coupling etc. Further, all necessary MATLAB and VHDL codes are also given on appropriate pages for the readers' quick/ clear understanding.
Автор: Martin Haartman; Mikael ?stling Название: Low-Frequency Noise in Advanced MOS Devices ISBN: 9048174724 ISBN-13(EAN): 9789048174720 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits.
Описание: The book focuses on advanced characterization methods for thin-fi lm solar cells that have proven their relevance both for academic and corporate photovoltaic research and development.
Автор: P. Antognetti; D.A. Antoniadis; Robert W. Dutton; Название: Process and Device Simulation for MOS-VLSI Circuits ISBN: 9400968442 ISBN-13(EAN): 9789400968448 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, Sogesta, Urbino, Italy, July 12-23, 1982
Автор: Olaf Stenzel; Miloslav Ohl?dal Название: Optical Characterization of Thin Solid Films ISBN: 331975324X ISBN-13(EAN): 9783319753249 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Описание: The World Is Analog.- Review of Single-Crystal Silicon Properties.- PN Junctions.- Rectifying and Ohmic Contacts.- Bipolar and Junction Field-Effect Transistors.- High-Voltage and Power Transistors.- Passive Components.- Process Integration.- Mismatch and Noise.- Chip Reliability.
Описание: The subject of nano-scaled semiconductor devices and technology is a strategic and emerging area of relevant societal importance in our ubiquitous electronics era. This book is intended for those involved in the research, technology development, and societal-related applications where nano-scaled semiconductor devices are involved.
Автор: Ching-Hua Su Название: Vapor Crystal Growth and Characterization ISBN: 3030396541 ISBN-13(EAN): 9783030396541 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
The book describes developments in the crystal growth of bulk II-VI semiconductor materials. A fundamental, systematic, and in-depth study of the physical vapor transport (PVT) growth process is the key to producing high-quality single crystals of semiconductors. As such, the book offers a comprehensive overview of the extensive studies on ZnSe and related II-VI wide bandgap compound semiconductors, such as CdS, CdTe, ZnTe, ZnSeTe and ZnSeS. Further, it shows the detailed steps for the growth of bulk crystals enabling optical devices which can operate in the visible spectrum for applications such as blue light emitting diodes, lasers for optical displays and in the mid-IR wavelength range, high density recording, and military communications.
The book then discusses the advantages of crystallization from vapor compared to the conventional melt growth: lower processing temperatures, the purification process associated with PVT, and the improved surface morphology of the grown crystals, as well as the necessary drawbacks to the PVT process, such as the low and inconsistent growth rates and the low yield of single crystals. By presenting in-situ measurements of transport rate, partial pressures and interferometry, as well as visual observations, the book provides detailed insights into in the kinetics during the PVT process.
This book is intended for graduate students and professionals in materials science as well as engineers preparing and developing optical devices with semiconductors.
Автор: Savinov, V. P. (lomonosov Moscow State University, Moscow, Russia) Название: Physics of high frequency capacitive discharge ISBN: 1138600806 ISBN-13(EAN): 9781138600805 Издательство: Taylor&Francis Рейтинг: Цена: 33686.00 р. Наличие на складе: Нет в наличии.
Описание: This book describes the physical mechanism of high-frequency (radio-frequency) capacitive discharge (RFCD) of low and medium pressure and the properties of discharge plasma in detail. The work is intended for scientists engaged in gas discharge physics and low-temperature plasmas, and relevant specialties.
Автор: Rashid M. Ansari; Moses O. Tade Название: Nonlinear Model-based Process Control ISBN: 1447111923 ISBN-13(EAN): 9781447111924 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The series Advances in Industrial Control aims to report and encourage technology transfer in control engineering. New theory, new controllers, actuators, sensors, new industrial processes, computer methods, new applications, new philosophies ...
Автор: Massimo Alioto; Gaetano Palumbo Название: Model and Design of Bipolar and MOS Current-Mode Logic ISBN: 1441952586 ISBN-13(EAN): 9781441952585 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Current-Mode digital circuits have been extensively analyzed and used since the early days of digital ICs.
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