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Electron Microscopy in Science and Engineering, Biswas Krishanu, Sri Sivakumar, Gurao Nilesh


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Цена: 22359.00р.
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Автор: Biswas Krishanu, Sri Sivakumar, Gurao Nilesh
Название:  Electron Microscopy in Science and Engineering
ISBN: 9789811651007
Издательство: Springer
Классификация:

ISBN-10: 9811651000
Обложка/Формат: Hardcover
Вес: 0.66 кг.
Дата издания: 06.11.2021
Серия: Iitk directions
Язык: English
Издание: 1st ed. 2022
Иллюстрации: 25 tables, color; 134 illustrations, color; 18 illustrations, black and white; xii, 147 p. 152 illus., 134 illus. in color.
Размер: 279 x 210
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.
Дополнительное описание: Small scale deformation experiments inside an SEM.- In-situ Micromechanical Testing in Scanning Electron Microscopy.- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health.- Electron Backscatter Diffraction Tec



4d electron microscopy

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
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Цена: 12751.00 р. 18216.00 -30%
Наличие на складе: Есть (2 шт.)
Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.

Microscopy, Immunohistochemistry, and Antigen Retrieval Methods / For Light and Electron Microscopy

Автор: Hayat M.A.
Название: Microscopy, Immunohistochemistry, and Antigen Retrieval Methods / For Light and Electron Microscopy
ISBN: 0306467704 ISBN-13(EAN): 9780306467707
Издательство: Springer
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Цена: 32004.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Histochemistry deals with the activities of chemical components in cells, and immunohistochemistry addresses the function of cell types in tissue or organs, such as those leading to acceptance or rejection of grafts or organs. This book is a methods volume focusing on antigen retrieval, particularly methods used in disease-related antigens. Because the book is a methods volume and a lab manual, it will have an audience of pathologists, biochemists, and lab technicians.

Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 10763.00 р.
Наличие на складе: Поставка под заказ.

Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 14673.00 р.
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Practical Electron Microscopy Of Lattice Defects

Автор: Hiroyasu Saka
Название: Practical Electron Microscopy Of Lattice Defects
ISBN: 9811234698 ISBN-13(EAN): 9789811234699
Издательство: World Scientific Publishing
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Цена: 15840.00 р.
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Описание: 'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]

Ultramicroscopy
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

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