Описание: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
Название: Advanced VLSI Design and Testability Issues ISBN: 0367492822 ISBN-13(EAN): 9780367492823 Издательство: Taylor&Francis Рейтинг: Цена: 16078.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
Описание: The technical contributions presented in this book will not only shorten the product development cycle, but also accelerate the adoption and further development of modern flow-based microfluidic biochips, by facilitating the full exploitation of design complexities that are possible with current fabrication techniques.
Описание: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.
Описание: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
Автор: Cherry Bhargava, Gaurav Mani Khanal Название: Advanced VLSI Technology ISBN: 877022174X ISBN-13(EAN): 9788770221740 Издательство: Taylor&Francis Рейтинг: Цена: 14851.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The trend in design and manufacturing of very large-scale integrated (VLSI) circuits is towards smaller devices on increasing wafer dimensions. VLSI is the inter-disciplinary science of the process of creating an integrated circuit (IC) by combining thousands of transistors into a single chip. VLSI design can reduce the area of the circuit, making it less expensive and requiring less power.
The book gives an understanding of the underlying principles of the subject. It not only focuses on circuit design process obeying VLSI rules but also on technological aspects of prototyping and fabrication. All the clocking processes, interconnects, and circuits of CMOS are explained in this book in an understandable format. The book provides contents on VLSI Physical Design Automation, Design of VLSI Devices and also its Impact on Physical Design.
The book is intended as a reference book for senior undergraduate, first-year post graduate students, researchers as well as academicians in VLSI design, electronics & electrical engineering, and materials science. The basics and applications of VLSI design from STA, PDA and VLSI Testing along with FPGA based Prototyping are covered in a comprehensive manner.
The latest technology used in VLSI design is discussed along with the available tools for FPGA prototyping as well as ASIC design. Each unit contains technical questions with solutions at the end.
Technical topics discussed in the book include:
Static Timing Analysis
CMOS Layout and Design rules
Physical Design Automation
Testing of VLSI Circuits
Software tools for Frontend and Backend design
Автор: F.P.M. Beenker; R.G. Bennetts; A.P. Thijssen Название: Testability Concepts for Digital ICs ISBN: 0792396588 ISBN-13(EAN): 9780792396581 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Considering the testability aspects for digital ICs, this book integrates the testability aspects into the design and manufacturing of ICs and, for each IC design project, gives a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets.
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