Автор: Ryu, Yu Kyoung Rodrigo, Javier Martinez Название: Scanning probe lithography ISBN: 1032122145 ISBN-13(EAN): 9781032122144 Издательство: Taylor&Francis Рейтинг: Цена: 15004.00 р. Наличие на складе: Нет в наличии.
Описание: The most complete book available on scanning probe lithography (SPL), this work details the modalities, mechanisms, and current technologies, applications, and materials on which SPL can be performed. It provides a comprehensive overview of this simple and cost-effective technique, which does not require clean room conditions and can be performed in any lab or industry facility to achieve high-resolution and high-quality patterns on a wide range of materials: biological, semiconducting, polymers, and 2D materials.• Introduces historical background of SPL, including evolution of the technique and tools • Explains the mechanism of sample modification/manipulation, types of AFM tips, technical parts of the experimental setup, and materials on which the technique can be applied • Shows the different types of devices and structures fabricated by SPL, together with the processing steps • Contains a complete and state-of-the art package of examples and different approaches, performed by different international research groups • Summarizes strengths, limitations, and potential of SPL This book is aimed at advanced students, technicians, and researchers in materials science, microelectronics, and others working with lithographic techniques and fabrication processes.
Автор: Adam Foster; Werner A. Hofer Название: Scanning Probe Microscopy ISBN: 1441923063 ISBN-13(EAN): 9781441923066 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
Автор: Meyer, Ernst Bennewitz, Roland Hug, Hans-josef Название: Scanning probe microscopy ISBN: 3030370887 ISBN-13(EAN): 9783030370886 Издательство: Springer Рейтинг: Цена: 7965.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts.
Автор: Roland Wiesendanger; Hans-Joachim G?ntherodt Название: Scanning Tunneling Microscopy III ISBN: 3540608249 ISBN-13(EAN): 9783540608240 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Providing an introduction to the theoretical foundations of STM and related scanning probe methods, this work outlines the various theoretical concepts developed in the past, and discusses the implications of the theoretical results for the interpretation of experimental data.
Автор: Bharat Bhushan; Harald Fuchs; Satoshi Kawata Название: Applied Scanning Probe Methods V ISBN: 3642072119 ISBN-13(EAN): 9783642072116 Издательство: Springer Рейтинг: Цена: 23751.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Автор: Seizo Morita Название: Roadmap of Scanning Probe Microscopy ISBN: 3642070698 ISBN-13(EAN): 9783642070693 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Автор: T. Sakurai; Y. Watanabe Название: Advances in Scanning Probe Microscopy ISBN: 3642630847 ISBN-13(EAN): 9783642630842 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland.
Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat Название: Bringing Scanning Probe Microscopy up to Speed ISBN: 1461373530 ISBN-13(EAN): 9781461373537 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.
Автор: Kim Название: Self-Assembled Water Chains ISBN: 3031190858 ISBN-13(EAN): 9783031190858 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Despite advances in the long-range electrostatic double-layer force, which depends strongly on ionic strength in water by using theoretical models such as DLVO (Derjaguin, Landau, Verwey, and Overbeek), the structure of confined water in air still remains widely unknown and has led to a variety of unexplained phenomena. This book bridges that gap by introducing a newly developed scanning probe miscroscopy (SPM) approach, which enables one to probe confined water at the molecular and atomic scale. Written by the developer of SPM, this book covers this new approach, as well as original approaches to addressing general interfacial water issues. It also introduces the cantilever-based optical interfacial force microscope (COIFM), which was invented by the author along with the methodology. The improved understanding will contribute to liquid-based nano- and bio-technologies such as lab-on-a-chip technologies, nanofluidic devices, dip-pen nanolithography, nano-oxidation, water-based granular interactions, liquid-based nanolubricants, hydration layers in biopolymers, manipulation of biomolecules, protein folding, stability of colloid suspensions, enzyme activity, swelling in clays, development of bioactive surfaces, water columns and ion channeling in membranes and scanning probe microscopy (SPM). It will also contribute to the improved performance of moving components in silicon-based micro-electro-mechanical system (MEMS) devices, where water plays a key role in interfacial interactions.
Описание: This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers` understanding and visualization.
Автор: Pratibha L. Gai Название: In-Situ Microscopy in Materials Research ISBN: 1461378508 ISBN-13(EAN): 9781461378501 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Francesco Marinello; Daniele Passeri; Enrico Savio Название: Acoustic Scanning Probe Microscopy ISBN: 3642430791 ISBN-13(EAN): 9783642430794 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
