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Scanning probe lithography, Ryu, Yu Kyoung Rodrigo, Javier Martinez


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Автор: Ryu, Yu Kyoung Rodrigo, Javier Martinez   (Ю Кьонг Рю)
Название:  Scanning probe lithography
Перевод названия: Ю Кьонг Рю: Сканирующая зондовая литография
ISBN: 9781032122144
Издательство: Taylor&Francis
Классификация:






ISBN-10: 1032122145
Обложка/Формат: Hardback
Страницы: 128
Вес: 0.33 кг.
Дата издания: 22.12.2022
Серия: Emerging materials and technologies
Язык: English
Иллюстрации: 17 line drawings, black and white; 43 halftones, black and white; 60 illustrations, black and white
Размер: 162 x 240 x 14
Подзаголовок: Fundamentals, materials, and applications
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Поставляется из: Европейский союз
Описание: The most complete book available on scanning probe lithography (SPL), this work details the modalities, mechanisms, and current technologies, applications, and materials on which SPL can be performed. It provides a comprehensive overview of this simple and cost-effective technique, which does not require clean room conditions and can be performed in any lab or industry facility to achieve high-resolution and high-quality patterns on a wide range of materials: biological, semiconducting, polymers, and 2D materials.• Introduces historical background of SPL, including evolution of the technique and tools • Explains the mechanism of sample modification/manipulation, types of AFM tips, technical parts of the experimental setup, and materials on which the technique can be applied • Shows the different types of devices and structures fabricated by SPL, together with the processing steps • Contains a complete and state-of-the art package of examples and different approaches, performed by different international research groups • Summarizes strengths, limitations, and potential of SPL This book is aimed at advanced students, technicians, and researchers in materials science, microelectronics, and others working with lithographic techniques and fabrication processes.
Дополнительное описание: 1. Historical Background and Positioning in the Lithography Roadmap. 2. Basic Concepts and Modalities. 3. Mechanical Scanning Probe Lithography. 4. Dip Pen Nanolithography. 5. Field Emission Scanning Probe Lithography. 6. Oxidation Scanning Probe Lithogra



Scanning Probe Lithography

Автор: Hyongsok T. Soh; Kathryn Wilder Guarini; Calvin F.
Название: Scanning Probe Lithography
ISBN: 0792373618 ISBN-13(EAN): 9780792373612
Издательство: Springer
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Цена: 23757.00 р.
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Описание: Describes advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample. This book describes the historical context, the relevant inventions, and the prospects for eventual manufacturing use of this technology.

Scanning Probe Lithography

Автор: Hyongsok T. Soh; Kathryn Wilder Guarini; Calvin F.
Название: Scanning Probe Lithography
ISBN: 1441948945 ISBN-13(EAN): 9781441948946
Издательство: Springer
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Цена: 23757.00 р.
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Описание: Scanning Probe Lithography (SPL) describes recent advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample.

Applied Scanning Probe Methods V

Автор: Bharat Bhushan; Harald Fuchs; Satoshi Kawata
Название: Applied Scanning Probe Methods V
ISBN: 3642072119 ISBN-13(EAN): 9783642072116
Издательство: Springer
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Цена: 23751.00 р.
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Описание: The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy

Автор: Adam Foster; Werner A. Hofer
Название: Scanning Probe Microscopy
ISBN: 1441923063 ISBN-13(EAN): 9781441923066
Издательство: Springer
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Цена: 19589.00 р.
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Описание: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

In-Situ Microscopy in Materials Research

Автор: Pratibha L. Gai
Название: In-Situ Microscopy in Materials Research
ISBN: 1461378508 ISBN-13(EAN): 9781461378501
Издательство: Springer
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Цена: 30606.00 р.
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Описание: 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1 Profile Mode 288 3. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 1 Surface Steps 295 3.

Acoustic Scanning Probe Microscopy

Автор: Francesco Marinello; Daniele Passeri; Enrico Savio
Название: Acoustic Scanning Probe Microscopy
ISBN: 3642430791 ISBN-13(EAN): 9783642430794
Издательство: Springer
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Цена: 16977.00 р.
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Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.

Nanomechanical and Nanoelectromechanical Phenomena in 2D-Atomic Crystals

Автор: Nicholas D. Kay
Название: Nanomechanical and Nanoelectromechanical Phenomena in 2D-Atomic Crystals
ISBN: 3319701800 ISBN-13(EAN): 9783319701806
Издательство: Springer
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Цена: 15372.00 р.
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Описание: This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers` understanding and visualization.

Scanning Probe Microscopy in Nanoscience and Nanotechnology

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology
ISBN: 3662502208 ISBN-13(EAN): 9783662502204
Издательство: Springer
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Цена: 40389.00 р.
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Описание: This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 3662506017 ISBN-13(EAN): 9783662506011
Издательство: Springer
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Цена: 28732.00 р.
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Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

Roadmap of Scanning Probe Microscopy

Автор: Seizo Morita
Название: Roadmap of Scanning Probe Microscopy
ISBN: 3642070698 ISBN-13(EAN): 9783642070693
Издательство: Springer
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Цена: 19589.00 р.
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Описание: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Advances in Scanning Probe Microscopy

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3642630847 ISBN-13(EAN): 9783642630842
Издательство: Springer
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Цена: 13974.00 р.
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Описание: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland.

Scanning Tunneling Microscopy III

Автор: Roland Wiesendanger; Hans-Joachim G?ntherodt
Название: Scanning Tunneling Microscopy III
ISBN: 3540608249 ISBN-13(EAN): 9783540608240
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Providing an introduction to the theoretical foundations of STM and related scanning probe methods, this work outlines the various theoretical concepts developed in the past, and discusses the implications of the theoretical results for the interpretation of experimental data.


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