Principles of Light Microscopy: From Basic to Advanced, Nechyporuk-Zloy
Автор: Merin Sara Thomas Название: Advanced microscopy : ISBN: 177491042X ISBN-13(EAN): 9781774910429 Издательство: Taylor&Francis Рейтинг: Цена: 20059.00 р. Наличие на складе: Поставка под заказ.
Описание: This interdisciplinary book covers the methodology and applications of different advanced microscopic techniques in various research fields, including chemistry, nanotechnology, chemical engineering, and biomedical engineering, providing an informative overview that helps to determine the best applications for advanced materials.
Автор: Dimitry N. Frolov Название: Microscope Design: Volume 1: Principles ISBN: 1510639934 ISBN-13(EAN): 9781510639935 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 13814.00 р. Наличие на складе: Нет в наличии.
Описание: Traces the historical development of microscopy instruments from their invention to the current state of the art. New concepts and engineering solutions are presented for modern light microscopes, with a focus on the practical construction of optical systems. Real design parameters of dioptric objectives and other systems are provided.
Автор: Callaghan, Paul Название: Principles of nuclear magnetic resonance microscopy ISBN: 0198539975 ISBN-13(EAN): 9780198539971 Издательство: Oxford Academ Рейтинг: Цена: 14573.00 р. Наличие на складе: Поставка под заказ.
Описание: This highly successful book, details the underlying principles behind the use of magnetic field gradients to image molecular distribution and molecular motion, providing many examples by way of illustration. Following excellent reviews of the hardback edition the book is now available in paperback.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 3319398768 ISBN-13(EAN): 9783319398761 Издательство: Springer Рейтинг: Цена: 11179.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Название: Advanced fluorescence microscopy ISBN: 1493920790 ISBN-13(EAN): 9781493920792 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Scalettar, Bethe A. Название: Introductory Biomedical Imaging ISBN: 1032328193 ISBN-13(EAN): 9781032328195 Издательство: Taylor&Francis Рейтинг: Цена: 17609.00 р. Наличие на складе: Поставка под заказ.
Автор: David C. Joy Название: Helium Ion Microscopy ISBN: 1461486599 ISBN-13(EAN): 9781461486596 Издательство: Springer Рейтинг: Цена: 7836.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 0387258000 ISBN-13(EAN): 9780387258003 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie Название: Scanning Tunneling Microscopy I ISBN: 3540584153 ISBN-13(EAN): 9783540584155 Издательство: Springer Рейтинг: Цена: 9141.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur- rent, which flows on application of a bias voltage, to sense the atomic and elec- tronic surface structure with atomic resolution!
Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie Название: Scanning Tunneling Microscopy I ISBN: 3642973450 ISBN-13(EAN): 9783642973451 Издательство: Springer Рейтинг: Цена: 11173.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment.
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