Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Автор: Hytch, Martin Название: Advances In Imaging And Electron Physics,213 ISBN: 0128209976 ISBN-13(EAN): 9780128209974 Издательство: Elsevier Science Рейтинг: Цена: 30318.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Автор: Hÿtch Martin, Hawkes Peter W. Название: Quantitative Atomic-Resolution Electron Microscopy, 217 ISBN: 0128246073 ISBN-13(EAN): 9780128246078 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting, Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,219 ISBN: 012824612X ISBN-13(EAN): 9780128246122 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Автор: Hawkes Peter W., Hytch Martin Название: The Beginnings of Electron Microscopy - Part 2: Volume 221 ISBN: 0323989195 ISBN-13(EAN): 9780323989190 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.
Автор: Hytch, Martin Название: Advances In Imaging And Electron Physics,223 ISBN: 0323988636 ISBN-13(EAN): 9780323988636 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This all-new Pathfinder (R) Guide covers two stunning island destinations in one unique volume - In Orkney, eight walks feature on the largest island, Mainland, with another six located on Hoy, Rousay and South Ronaldsay. In Shetland, seven routes explore Mainland, with seven more rambles on Bressay, Mousa, St Ninian`s Isle, Unst, West Burra and Y
Автор: Hawkes Peter W., Hytch Martin Название: The Beginnings of Electron Microscopy - Part 1 ISBN: 0323915078 ISBN-13(EAN): 9780323915076 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,184 ISBN: 0128001453 ISBN-13(EAN): 9780128001455 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Поставка под заказ.
Описание: The importance of good communication between health professionals and patients has been well documented. This casebook/workbook helps students, faculty, and health care providers to assess and practice key interpersonal and health communication skills. It presents 45 communication scenarios for students to critique and rewrite in order to enhance the interpersonal relationships of participants.
Автор: Hawkes, Peter W. Название: Advances in Imaging and Electron Physics,198 ISBN: 0128048107 ISBN-13(EAN): 9780128048108 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronicsand Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Автор: Hawkes, Peter Название: Hawkes-Advances in Imaging and Electron Physics V211 ISBN: 0128174692 ISBN-13(EAN): 9780128174692 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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