X-ray and Electron Diffraction Studies in Materials Science, Dyson, David
Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda Название: X-Ray Diffraction Crystallography ISBN: 3642442552 ISBN-13(EAN): 9783642442551 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
Описание: Proceedings of the NATO Advanced Research Workshop, Oxford, U.K., 18-22 March, 1991
Автор: C. Suryanarayana; M. Grant Norton Название: X-Ray Diffraction ISBN: 1489901507 ISBN-13(EAN): 9781489901507 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a hands on approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Описание: This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how
Автор: Tsirelson, V.G Название: Electron Density and Bonding in Crystals ISBN: 0750302844 ISBN-13(EAN): 9780750302845 Издательство: Taylor&Francis Рейтинг: Цена: 38280.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Ismail C. Noyan; Jerome B. Cohen Название: Residual Stress ISBN: 1461395712 ISBN-13(EAN): 9781461395713 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: De Graef Название: Structure of Materials ISBN: 1107005876 ISBN-13(EAN): 9781107005877 Издательство: Cambridge Academ Рейтинг: Цена: 9978.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The new edition of this highly readable, popular textbook covers the fundamentals of crystallography, symmetry and diffraction and applies these concepts to a large range of materials. Now with new end-of-chapter exercises, more illustrations, more streamlined coverage of crystallography and additional coverage of magnetic point group symmetry.
Автор: Eric J. Mittemeijer; Paolo Scardi Название: Diffraction Analysis of the Microstructure of Materials ISBN: 3642073522 ISBN-13(EAN): 9783642073526 Издательство: Springer Рейтинг: Цена: 32651.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.
Автор: Lyle H. Schwartz; Jerome B. Cohen Название: Diffraction from Materials ISBN: 3642829295 ISBN-13(EAN): 9783642829291 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950`s and 60`s.
Автор: Morawiec Название: Indexing of Crystal Diffraction Patterns ISBN: 3031110765 ISBN-13(EAN): 9783031110764 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Поставка под заказ.
Описание: This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination. The book is intended equally for materials scientists curious about ‘nuts and bolts’ of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.
