Structure from Diffraction Methods - Inorganic Materials Series, Bruce
Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda Название: X-Ray Diffraction Crystallography ISBN: 3642442552 ISBN-13(EAN): 9783642442551 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
Автор: Igor T. Selezov; Yuriy G. Kryvonos; Ivan S. Gandzh Название: Wave Propagation and Diffraction ISBN: 9811352674 ISBN-13(EAN): 9789811352676 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Поставка под заказ.
Описание: This book presents two distinct aspects of wave dynamics – wave propagation and diffraction – with a focus on wave diffraction. The authors apply different mathematical methods to the solution of typical problems in the theory of wave propagation and diffraction and analyze the obtained results. The rigorous diffraction theory distinguishes three approaches: the method of surface currents, where the diffracted field is represented as a superposition of secondary spherical waves emitted by each element (the Huygens–Fresnel principle); the Fourier method; and the separation of variables and Wiener–Hopf transformation method.Chapter 1 presents mathematical methods related to studying the problems of wave diffraction theory, while Chapter 2 deals with spectral methods in the theory of wave propagation, focusing mainly on the Fourier methods to study the Stokes (gravity) waves on the surface of inviscid fluid. Chapter 3 then presents some results of modeling the refraction of surface gravity waves on the basis of the ray method, which originates from geometrical optics. Chapter 4 is devoted to the diffraction of surface gravity waves and the final two chapters discuss the diffraction of waves by semi-infinite domains on the basis of method of images and present some results on the problem of propagation of tsunami waves.Lastly, it provides insights into directions for further developing the wave diffraction theory.
Описание: This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films.
Автор: Andr? Authier; Stefano Lagomarsino; Brian K. Tanne Название: X-Ray and Neutron Dynamical Diffraction ISBN: 1461376963 ISBN-13(EAN): 9781461376965 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996
Автор: De Graef Название: Structure of Materials ISBN: 1107005876 ISBN-13(EAN): 9781107005877 Издательство: Cambridge Academ Рейтинг: Цена: 9978.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The new edition of this highly readable, popular textbook covers the fundamentals of crystallography, symmetry and diffraction and applies these concepts to a large range of materials. Now with new end-of-chapter exercises, more illustrations, more streamlined coverage of crystallography and additional coverage of magnetic point group symmetry.
Автор: Morawiec Название: Indexing of Crystal Diffraction Patterns ISBN: 3031110765 ISBN-13(EAN): 9783031110764 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Поставка под заказ.
Описание: This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination. The book is intended equally for materials scientists curious about ‘nuts and bolts’ of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.
Автор: Eric J. Mittemeijer; Paolo Scardi Название: Diffraction Analysis of the Microstructure of Materials ISBN: 3642073522 ISBN-13(EAN): 9783642073526 Издательство: Springer Рейтинг: Цена: 32651.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.
Автор: Lyle H. Schwartz; Jerome B. Cohen Название: Diffraction from Materials ISBN: 3642829295 ISBN-13(EAN): 9783642829291 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950`s and 60`s.
Описание: This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how
Автор: Ismail C. Noyan; Jerome B. Cohen Название: Residual Stress ISBN: 1461395712 ISBN-13(EAN): 9781461395713 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
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