Deep Learning-Based Detection of Catenary Support Component Defect and Fault in High-Speed Railways, Liu
Автор: J. Chikawa; K. Sumino; K. Wada Название: Defects and Properties of Semiconductors ISBN: 9401086168 ISBN-13(EAN): 9789401086165 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.
Автор: C.H. Stapper; V.K. Jain; Gabriele Saucier Название: Defect and Fault Tolerance in VLSI Systems ISBN: 0306435314 ISBN-13(EAN): 9780306435317 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.
Автор: C.H. Stapper; V.K. Jain; Gabriele Saucier Название: Defect and Fault Tolerance in VLSI Systems ISBN: 1475799594 ISBN-13(EAN): 9781475799590 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.
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