Scanning Probe Microscopy in Industrial Applications - Nanomechanical Characterization, Yablon
Автор: Ryu, Yu Kyoung Rodrigo, Javier Martinez Название: Scanning probe lithography ISBN: 1032122145 ISBN-13(EAN): 9781032122144 Издательство: Taylor&Francis Рейтинг: Цена: 15004.00 р. Наличие на складе: Нет в наличии.
Описание: The most complete book available on scanning probe lithography (SPL), this work details the modalities, mechanisms, and current technologies, applications, and materials on which SPL can be performed. It provides a comprehensive overview of this simple and cost-effective technique, which does not require clean room conditions and can be performed in any lab or industry facility to achieve high-resolution and high-quality patterns on a wide range of materials: biological, semiconducting, polymers, and 2D materials.• Introduces historical background of SPL, including evolution of the technique and tools • Explains the mechanism of sample modification/manipulation, types of AFM tips, technical parts of the experimental setup, and materials on which the technique can be applied • Shows the different types of devices and structures fabricated by SPL, together with the processing steps • Contains a complete and state-of-the art package of examples and different approaches, performed by different international research groups • Summarizes strengths, limitations, and potential of SPL This book is aimed at advanced students, technicians, and researchers in materials science, microelectronics, and others working with lithographic techniques and fabrication processes.
Автор: Kim Название: Self-Assembled Water Chains ISBN: 3031190858 ISBN-13(EAN): 9783031190858 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Despite advances in the long-range electrostatic double-layer force, which depends strongly on ionic strength in water by using theoretical models such as DLVO (Derjaguin, Landau, Verwey, and Overbeek), the structure of confined water in air still remains widely unknown and has led to a variety of unexplained phenomena. This book bridges that gap by introducing a newly developed scanning probe miscroscopy (SPM) approach, which enables one to probe confined water at the molecular and atomic scale. Written by the developer of SPM, this book covers this new approach, as well as original approaches to addressing general interfacial water issues. It also introduces the cantilever-based optical interfacial force microscope (COIFM), which was invented by the author along with the methodology. The improved understanding will contribute to liquid-based nano- and bio-technologies such as lab-on-a-chip technologies, nanofluidic devices, dip-pen nanolithography, nano-oxidation, water-based granular interactions, liquid-based nanolubricants, hydration layers in biopolymers, manipulation of biomolecules, protein folding, stability of colloid suspensions, enzyme activity, swelling in clays, development of bioactive surfaces, water columns and ion channeling in membranes and scanning probe microscopy (SPM). It will also contribute to the improved performance of moving components in silicon-based micro-electro-mechanical system (MEMS) devices, where water plays a key role in interfacial interactions.
Автор: Seizo Morita Название: Roadmap of Scanning Probe Microscopy ISBN: 3642070698 ISBN-13(EAN): 9783642070693 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ISBN: 3662506017 ISBN-13(EAN): 9783662506011 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
Автор: Francesco Marinello; Daniele Passeri; Enrico Savio Название: Acoustic Scanning Probe Microscopy ISBN: 3642430791 ISBN-13(EAN): 9783642430794 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.
Автор: Bharat Bhushan; Harald Fuchs Название: Applied Scanning Probe Methods IV ISBN: 364206597X ISBN-13(EAN): 9783642065972 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- Applications of Heated Atomic Force Microscope Cantilevers.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology ISBN: 3662502208 ISBN-13(EAN): 9783662502204 Издательство: Springer Рейтинг: Цена: 40389.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 ISBN: 3662507250 ISBN-13(EAN): 9783662507254 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.
Автор: Bharat Bhushan; Harald Fuchs; Masahiko Tomitori Название: Applied Scanning Probe Methods X ISBN: 3642093426 ISBN-13(EAN): 9783642093425 Издательство: Springer Рейтинг: Цена: 27245.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Описание: This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers` understanding and visualization.
Автор: Bharat Bhushan; Harald Fuchs; Satoshi Kawata Название: Applied Scanning Probe Methods V ISBN: 3642072119 ISBN-13(EAN): 9783642072116 Издательство: Springer Рейтинг: Цена: 23751.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Описание: This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization. The isolation of graphene and, shortly after, a host of other 2D materials has attracted a great deal of interest in the scientific community for both their range of extremely desirable and their record-breaking properties. Amongst these properties are some of the highest elastic moduli and tensile strengths ever observed in nature. The work, which was undertaken at Lancaster University’s Physics department in conjunction with the University of Manchester and the National Physical Laboratory, offers a new approach to understanding the nanomechanical and nanoelectromechanical properties of 2D materials by utilising the nanoscale and nanosecond resolution of ultrasonic force and heterodyne force microscopy (UFM and HFM) – both contact mode atomic force microscopy (AFM) techniques. Using this approach and developing several other new techniques the authors succeeded in probing samples’ subsurface and mechanical properties, which would otherwise remain hidden. Lastly, by using a new technique, coined electrostatic heterodyne force microscopy (E-HFM), the authors were able to observe nanoscale electromechanical vibrations with a nanometre and nanosecond resolution, in addition to probing the local electrostatic environment of devices fabricated from 2D materials.
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